dc.contributor.author |
Vournas, CD |
en |
dc.contributor.author |
Van Cutsem, T |
en |
dc.date.accessioned |
2014-03-01T01:28:43Z |
|
dc.date.available |
2014-03-01T01:28:43Z |
|
dc.date.issued |
2008 |
en |
dc.identifier.issn |
0885-8950 |
en |
dc.identifier.uri |
https://dspace.lib.ntua.gr/xmlui/handle/123456789/18943 |
|
dc.subject |
Emergency detection |
en |
dc.subject |
Load tap changer |
en |
dc.subject |
Long-term voltage stability |
en |
dc.subject |
Overexcitation limiter |
en |
dc.subject |
Voltage collapse |
en |
dc.subject.classification |
Engineering, Electrical & Electronic |
en |
dc.subject.other |
Critical areas |
en |
dc.subject.other |
Distribution voltages |
en |
dc.subject.other |
Emergency detection |
en |
dc.subject.other |
Emergency situations |
en |
dc.subject.other |
Load tap changer |
en |
dc.subject.other |
Load tap changers |
en |
dc.subject.other |
Long-term voltage instability |
en |
dc.subject.other |
Long-term voltage stability |
en |
dc.subject.other |
Moving averages |
en |
dc.subject.other |
Overexcitation limiter |
en |
dc.subject.other |
Realistic test |
en |
dc.subject.other |
Test cases |
en |
dc.subject.other |
Time evolutions |
en |
dc.subject.other |
Time simulations |
en |
dc.subject.other |
Voltage collapse |
en |
dc.subject.other |
Voltage signaling |
en |
dc.subject.other |
Testing |
en |
dc.title |
Local identification of voltage emergency situations |
en |
heal.type |
journalArticle |
en |
heal.identifier.primary |
10.1109/TPWRS.2008.926425 |
en |
heal.identifier.secondary |
http://dx.doi.org/10.1109/TPWRS.2008.926425 |
en |
heal.language |
English |
en |
heal.publicationDate |
2008 |
en |
heal.abstract |
This paper proposes a simple procedure to identify the onset of long-term voltage instability from the time evolution of the distribution voltages controlled by load tap changers. The moving average of sampled measurements is computed and used to trigger local emergency signals. The method is validated on voltage signals obtained from time simulation of a realistic test system. The ability to identify instability in the critical area is demonstrated in three test cases. © 2008 IEEE. |
en |
heal.publisher |
IEEE-INST ELECTRICAL ELECTRONICS ENGINEERS INC |
en |
heal.journalName |
IEEE Transactions on Power Systems |
en |
dc.identifier.doi |
10.1109/TPWRS.2008.926425 |
en |
dc.identifier.isi |
ISI:000258032200047 |
en |
dc.identifier.volume |
23 |
en |
dc.identifier.issue |
3 |
en |
dc.identifier.spage |
1239 |
en |
dc.identifier.epage |
1248 |
en |