All-optical wavelength conversion at 160Gbit/s using SOA and silicon-on-insulator photonic circuit

Gomez-Agis, F; Raz, O; Zhang, SJ; Tangdiongga, E; Zimmermann, L; Voigt, K; Vyrsokinos, C; Stampoulidis, L; Dorren, HJS

dc.contributor.author	Gomez-Agis, F	en
dc.contributor.author	Raz, O	en
dc.contributor.author	Zhang, SJ	en
dc.contributor.author	Tangdiongga, E	en
dc.contributor.author	Zimmermann, L	en
dc.contributor.author	Voigt, K	en
dc.contributor.author	Vyrsokinos, C	en
dc.contributor.author	Stampoulidis, L	en
dc.contributor.author	Dorren, HJS	en
dc.date.accessioned	2014-03-01T01:29:49Z
dc.date.available	2014-03-01T01:29:49Z
dc.date.issued	2009	en
dc.identifier.issn	0013-5194	en
dc.identifier.uri	https://dspace.lib.ntua.gr/xmlui/handle/123456789/19354
dc.subject	Silicon On Insulator	en
dc.subject	Wavelength Conversion	en
dc.subject.classification	Engineering, Electrical & Electronic	en
dc.subject.other	160Gbit/s	en
dc.subject.other	All optical wavelength converter	en
dc.subject.other	All-optical wavelength conversion	en
dc.subject.other	Error free operations	en
dc.subject.other	Mach-Zehnder delay interferometers	en
dc.subject.other	Photonic circuits	en
dc.subject.other	Silicon on insulator	en
dc.subject.other	Light amplifiers	en
dc.subject.other	Microsensors	en
dc.subject.other	Optical frequency conversion	en
dc.subject.other	Optoelectronic devices	en
dc.subject.other	Photolithography	en
dc.subject.other	Semiconducting silicon	en
dc.subject.other	Semiconducting silicon compounds	en
dc.title	All-optical wavelength conversion at 160Gbit/s using SOA and silicon-on-insulator photonic circuit	en
heal.type	journalArticle	en
heal.identifier.primary	10.1049/el.2009.2340	en
heal.identifier.secondary	http://dx.doi.org/10.1049/el.2009.2340	en
heal.language	English	en
heal.publicationDate	2009	en
heal.abstract	Error-free operation of an all-optical wavelength converter at 160Gbit/s based on a semiconductor optical amplifier and a silicon-on-insulator photonic circuit, consisting of two cascaded Mach-Zehnder delay interferometers, is demonstrated. © 2009 The Institution of Engineering and Technology.	en
heal.publisher	INST ENGINEERING TECHNOLOGY-IET	en
heal.journalName	Electronics Letters	en
dc.identifier.doi	10.1049/el.2009.2340	en
dc.identifier.isi	ISI:000271279200020	en
dc.identifier.volume	45	en
dc.identifier.issue	22	en
dc.identifier.spage	1132	en
dc.identifier.epage	1133	en