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Application of piezoresistance effect in highly uniaxially strained p-Si and n-Si for current-carrier mobility increase

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dc.contributor.author Kolomoets, V en
dc.contributor.author Baidakov, V en
dc.contributor.author Fedosov, A en
dc.contributor.author Gorin, A en
dc.contributor.author Ermakov, V en
dc.contributor.author Liarokapis, E en
dc.contributor.author Gromova, G en
dc.contributor.author Kazbekova, B en
dc.contributor.author Taimuratova, L en
dc.contributor.author Orasgulyev, B en
dc.date.accessioned 2014-03-01T01:29:52Z
dc.date.available 2014-03-01T01:29:52Z
dc.date.issued 2009 en
dc.identifier.issn 0370-1972 en
dc.identifier.uri https://dspace.lib.ntua.gr/xmlui/handle/123456789/19385
dc.subject.classification Physics, Condensed Matter en
dc.title Application of piezoresistance effect in highly uniaxially strained p-Si and n-Si for current-carrier mobility increase en
heal.type journalArticle en
heal.identifier.primary 10.1002/pssb.200880508 en
heal.identifier.secondary http://dx.doi.org/10.1002/pssb.200880508 en
heal.language English en
heal.publicationDate 2009 en
heal.abstract Uniaxially strained channels occur in silicon p-MOS transistors and n-MOS transistors (IEDM Tech. Dig., pp. 61-64 (2002) and pp. 978-980 (2003) [1,2]). Both longitudinal piezoresistance (PR) and transverse PR investigation in highly uniaxially strained p-Si(B) and n-Si(P) are presented. It is shown that the strong anisotropy of longitudinal PR and transverse PR are caused by the pressure-induced change of isoenergetic surface shape, i.e. by the change of heavy-hole effective mass and its anisotropy. In n-Si the change of the longitudinal PR and transverse PR at X{double pipe} [100] is determined by both the change of the f-transition probability with increasing pressure and the redistribution of electrons between the valleys with the effective mass m{double pipe} (longitudinal PR) and m{box drawings light up and horizontal} (transverse PR). © 2009 WILEY-VCH Verlag GmbH & Co. KGaA, Weinheim. en
heal.publisher WILEY-V C H VERLAG GMBH en
heal.journalName Physica Status Solidi (B) Basic Research en
dc.identifier.doi 10.1002/pssb.200880508 en
dc.identifier.isi ISI:000264244500039 en
dc.identifier.volume 246 en
dc.identifier.issue 3 en
dc.identifier.spage 652 en
dc.identifier.epage 654 en


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