dc.contributor.author |
Kolomoets, V |
en |
dc.contributor.author |
Baidakov, V |
en |
dc.contributor.author |
Fedosov, A |
en |
dc.contributor.author |
Gorin, A |
en |
dc.contributor.author |
Ermakov, V |
en |
dc.contributor.author |
Liarokapis, E |
en |
dc.contributor.author |
Gromova, G |
en |
dc.contributor.author |
Kazbekova, B |
en |
dc.contributor.author |
Taimuratova, L |
en |
dc.contributor.author |
Orasgulyev, B |
en |
dc.date.accessioned |
2014-03-01T01:29:52Z |
|
dc.date.available |
2014-03-01T01:29:52Z |
|
dc.date.issued |
2009 |
en |
dc.identifier.issn |
0370-1972 |
en |
dc.identifier.uri |
https://dspace.lib.ntua.gr/xmlui/handle/123456789/19385 |
|
dc.subject.classification |
Physics, Condensed Matter |
en |
dc.title |
Application of piezoresistance effect in highly uniaxially strained p-Si and n-Si for current-carrier mobility increase |
en |
heal.type |
journalArticle |
en |
heal.identifier.primary |
10.1002/pssb.200880508 |
en |
heal.identifier.secondary |
http://dx.doi.org/10.1002/pssb.200880508 |
en |
heal.language |
English |
en |
heal.publicationDate |
2009 |
en |
heal.abstract |
Uniaxially strained channels occur in silicon p-MOS transistors and n-MOS transistors (IEDM Tech. Dig., pp. 61-64 (2002) and pp. 978-980 (2003) [1,2]). Both longitudinal piezoresistance (PR) and transverse PR investigation in highly uniaxially strained p-Si(B) and n-Si(P) are presented. It is shown that the strong anisotropy of longitudinal PR and transverse PR are caused by the pressure-induced change of isoenergetic surface shape, i.e. by the change of heavy-hole effective mass and its anisotropy. In n-Si the change of the longitudinal PR and transverse PR at X{double pipe} [100] is determined by both the change of the f-transition probability with increasing pressure and the redistribution of electrons between the valleys with the effective mass m{double pipe} (longitudinal PR) and m{box drawings light up and horizontal} (transverse PR). © 2009 WILEY-VCH Verlag GmbH & Co. KGaA, Weinheim. |
en |
heal.publisher |
WILEY-V C H VERLAG GMBH |
en |
heal.journalName |
Physica Status Solidi (B) Basic Research |
en |
dc.identifier.doi |
10.1002/pssb.200880508 |
en |
dc.identifier.isi |
ISI:000264244500039 |
en |
dc.identifier.volume |
246 |
en |
dc.identifier.issue |
3 |
en |
dc.identifier.spage |
652 |
en |
dc.identifier.epage |
654 |
en |