Magnetostrictive behaviour of ribbons and wires: Analytical modelling and experimental validation

Mamalis, A; Hristoforou, E

dc.contributor.author	Mamalis, A	en
dc.contributor.author	Hristoforou, E	en
dc.date.accessioned	2014-03-01T01:31:02Z
dc.date.available	2014-03-01T01:31:02Z
dc.date.issued	2009	en
dc.identifier.issn	1454-4164	en
dc.identifier.uri	https://dspace.lib.ntua.gr/xmlui/handle/123456789/19719
dc.relation.uri	http://www.scopus.com/inward/record.url?eid=2-s2.0-75949116491&partnerID=40&md5=a498be60570603cc384ee28723339bcc	en
dc.subject	Analytical modeling	en
dc.subject	Magnetostriction	en
dc.subject	Ribbons	en
dc.subject	Sensors	en
dc.subject	Wires	en
dc.subject.classification	Materials Science, Multidisciplinary	en
dc.subject.classification	Optics	en
dc.subject.classification	Physics, Applied	en
dc.subject.other	ANNEALED AMORPHOUS WIRES	en
dc.subject.other	THIN-FILMS	en
dc.subject.other	DELAY-LINE	en
dc.subject.other	SATURATION MAGNETOSTRICTION	en
dc.subject.other	MAGNETOELASTIC PROPERTIES	en
dc.subject.other	MAGNETIC-PROPERTIES	en
dc.subject.other	METALLIC GLASSES	en
dc.subject.other	SENSOR	en
dc.subject.other	WAVES	en
dc.subject.other	PROPAGATION	en
dc.title	Magnetostrictive behaviour of ribbons and wires: Analytical modelling and experimental validation	en
heal.type	journalArticle	en
heal.language	English	en
heal.publicationDate	2009	en
heal.abstract	In this paper the magnetostrictive behaviour of ribbons and wires is revisited and studied, proposing an analytical modelling followed by experimental validation using the magnetostrictive delay line (MDL) method, due to the needs for engineering applications of magnetostriction, like sensors and transducers. The obtained results may be used for the determination of the M(H) and λ(H) functions as well as their uniformity distribution along the length of magnetostrictive ribbons and wires, which is a key-factor for the characteristics of sensors based on the magnetostriction effect.	en
heal.publisher	NATL INST OPTOELECTRONICS	en
heal.journalName	Journal of Optoelectronics and Advanced Materials	en
dc.identifier.isi	ISI:000263377300006	en
dc.identifier.volume	11	en
dc.identifier.issue	1	en
dc.identifier.spage	45	en
dc.identifier.epage	55	en