On the connection between dielectric breakdown strength, trapping of charge, and contact angle saturation in electrowetting

Drygiannakis, AI; Papathanasiou, AG; Boudouvis, AG

dc.contributor.author	Drygiannakis, AI	en
dc.contributor.author	Papathanasiou, AG	en
dc.contributor.author	Boudouvis, AG	en
dc.date.accessioned	2014-03-01T01:31:34Z
dc.date.available	2014-03-01T01:31:34Z
dc.date.issued	2009	en
dc.identifier.issn	0743-7463	en
dc.identifier.uri	https://dspace.lib.ntua.gr/xmlui/handle/123456789/19816
dc.subject	Contact Angle	en
dc.subject.classification	Chemistry, Physical	en
dc.subject.other	Charge trapping	en
dc.subject.other	Contact angle	en
dc.subject.other	Dielectric properties	en
dc.subject.other	Electric breakdown	en
dc.subject.other	Electric fields	en
dc.subject.other	Electric switches	en
dc.subject.other	Silicon compounds	en
dc.subject.other	Applied voltages	en
dc.subject.other	Contact angle saturations	en
dc.subject.other	Dielectric breakdown strengths	en
dc.subject.other	Electric field strengths	en
dc.subject.other	Electrowetting	en
dc.subject.other	Electrowetting on dielectrics	en
dc.subject.other	Element methods	en
dc.subject.other	Experimental datum	en
dc.subject.other	Field-induced transitions	en
dc.subject.other	Fitting parameters	en
dc.subject.other	Material breakdowns	en
dc.subject.other	Parylene-n	en
dc.subject.other	Solid dielectrics	en
dc.subject.other	Voltage dependences	en
dc.subject.other	Dielectric materials	en
dc.title	On the connection between dielectric breakdown strength, trapping of charge, and contact angle saturation in electrowetting	en
heal.type	journalArticle	en
heal.identifier.primary	10.1021/la802551j	en
heal.identifier.secondary	http://dx.doi.org/10.1021/la802551j	en
heal.language	English	en
heal.publicationDate	2009	en
heal.abstract	Electrowetting on dielectric (EWOD) is simulated by solving the equations of capillary electrohydrostatics, by the Galerkin/finite element method. Aiming to provide reliable predictions of the voltage dependence of the apparent contact angle, close to or beyond the saturation limit, special attention is given in the treatment of the dielectric properties of the solid dielectric where the liquid sits. It is proposed that in regions where the electric field strength locally exceeds the material breakdown strength, the dielectric locally switches to a conductor. Without using any fitting parameter, the implementation of the proposed phenomenological idea realized a surprising matching of published experimental data concerning materials ranging from SiO2 to Parylene N and Teflon. Charge trapping is naturally connected to the field-induced transition, and its distribution as well as its dependence on the applied voltage is calculated. © 2009 American Chemical Society.	en
heal.publisher	AMER CHEMICAL SOC	en
heal.journalName	Langmuir	en
dc.identifier.doi	10.1021/la802551j	en
dc.identifier.isi	ISI:000262176600031	en
dc.identifier.volume	25	en
dc.identifier.issue	1	en
dc.identifier.spage	147	en
dc.identifier.epage	152	en