Oxide density distribution across the barrier layer during the steady state growth of porous anodic alumina films: Chronopotentiometry, kinetics of mass and thickness evolution and a high field ionic migration model

Patermarakis, G; Karayianni, H; Masavetas, K; Chandrinos, J

dc.contributor.author	Patermarakis, G	en
dc.contributor.author	Karayianni, H	en
dc.contributor.author	Masavetas, K	en
dc.contributor.author	Chandrinos, J	en
dc.date.accessioned	2014-03-01T01:31:37Z
dc.date.available	2014-03-01T01:31:37Z
dc.date.issued	2009	en
dc.identifier.issn	1432-8488	en
dc.identifier.uri	https://dspace.lib.ntua.gr/xmlui/handle/123456789/19845
dc.subject	Al to oxide lattice transformation	en
dc.subject	Fluidity	en
dc.subject	Growth mechanism	en
dc.subject	Oxide density spectrum	en
dc.subject	Porous anodic alumina	en
dc.subject.classification	Electrochemistry	en
dc.subject.other	Al to oxide lattice transformation	en
dc.subject.other	Anodising	en
dc.subject.other	Barrier layers	en
dc.subject.other	Chronopotentiometry	en
dc.subject.other	Current efficiency	en
dc.subject.other	Density distributions	en
dc.subject.other	Density maxima	en
dc.subject.other	Electrolyte interfaces	en
dc.subject.other	Field strengths	en
dc.subject.other	Fluid materials	en
dc.subject.other	Growth mechanism	en
dc.subject.other	High field	en
dc.subject.other	Initial density	en
dc.subject.other	Ionic migration	en
dc.subject.other	Mass balance	en
dc.subject.other	Mean values	en
dc.subject.other	Oxide interfaces	en
dc.subject.other	Porous anodic alumina	en
dc.subject.other	Porous anodic alumina films	en
dc.subject.other	Steady state	en
dc.subject.other	Transport number	en
dc.subject.other	Alumina	en
dc.subject.other	Aluminum	en
dc.subject.other	Aluminum sheet	en
dc.subject.other	Electrolytes	en
dc.subject.other	Film growth	en
dc.subject.other	Fluidity	en
dc.subject.other	Growth kinetics	en
dc.subject.other	Optical microscopy	en
dc.subject.other	Oxide films	en
dc.title	Oxide density distribution across the barrier layer during the steady state growth of porous anodic alumina films: Chronopotentiometry, kinetics of mass and thickness evolution and a high field ionic migration model	en
heal.type	journalArticle	en
heal.identifier.primary	10.1007/s10008-008-0745-6	en
heal.identifier.secondary	http://dx.doi.org/10.1007/s10008-008-0745-6	en
heal.language	English	en
heal.publicationDate	2009	en
heal.abstract	The steady state growth of porous anodic alumina films in oxalate solutions at various conditions was studied by chronopotentiometry, mass balance and optical microscopy methods enabling determination of consumed Al, film mass and thickness, current efficiencies, Al3+ and O2- transport numbers across barrier layer, etc. The film thickness growth rate was found to be proportional to O2- anionic current. A high field ionic migration model was developed. It predicted that, during anodising, the local oxide density across barrier layer rises from 2.6 in Al\|oxide to 4.59-5.22 g cm-3 in oxide\|electrolyte interface with mean value ≈3.21-3.52 g cm-3. The field strength rises from the first to second interface. The mechanism of Al oxidation near the Al\|oxide interface embraces the transformation of the Al lattice to a transient, rare oxide one sustained by field with comparable Al3+ spacing parameter. The oxide near the Al\|oxide interface and around the density maximum in the oxide\|electrolyte interface are under different levels of electro-restriction stresses. During relaxation, the oxide behaves like a solid-fluid material suppressing the initial density distribution. © 2008 Springer-Verlag.	en
heal.publisher	SPRINGER	en
heal.journalName	Journal of Solid State Electrochemistry	en
dc.identifier.doi	10.1007/s10008-008-0745-6	en
dc.identifier.isi	ISI:000270872000005	en
dc.identifier.volume	13	en
dc.identifier.issue	12	en
dc.identifier.spage	1831	en
dc.identifier.epage	1847	en