dc.contributor.author |
Valagiannopoulos, CA |
en |
dc.date.accessioned |
2014-03-01T01:32:28Z |
|
dc.date.available |
2014-03-01T01:32:28Z |
|
dc.date.issued |
2010 |
en |
dc.identifier.issn |
0272-6343 |
en |
dc.identifier.uri |
https://dspace.lib.ntua.gr/xmlui/handle/123456789/20152 |
|
dc.subject |
inverse scattering |
en |
dc.subject |
low-contrast objects |
en |
dc.subject |
multiple integral |
en |
dc.subject |
scattering theorem |
en |
dc.subject |
Taylor expansion |
en |
dc.subject.classification |
Engineering, Electrical & Electronic |
en |
dc.subject.other |
Background medium |
en |
dc.subject.other |
Inverse scattering |
en |
dc.subject.other |
low-contrast objects |
en |
dc.subject.other |
Multiple integral |
en |
dc.subject.other |
Parameter variation |
en |
dc.subject.other |
Scattering integral |
en |
dc.subject.other |
Taylor expansions |
en |
dc.subject.other |
Electromagnetic fields |
en |
dc.subject.other |
Expansion |
en |
dc.subject.other |
Scattering |
en |
dc.title |
A new inverse formula based on the taylor expansion of the scattering integral |
en |
heal.type |
journalArticle |
en |
heal.identifier.primary |
10.1080/02726343.2010.513930 |
en |
heal.identifier.secondary |
http://dx.doi.org/10.1080/02726343.2010.513930 |
en |
heal.language |
English |
en |
heal.publicationDate |
2010 |
en |
heal.abstract |
The influence of an illuminated object on the measured electromagnetic field is specified through the well-known scattering integral. One can obtain the Taylor expansion of this expression with respect to the permittivity of the scatterer, under the assumption that its texture does not differ substantially from the background medium. In this way, novel inverse formulas for the object material are derived and are not exclusively suitable for low-contrast cases. The proposed technique is implemented in a particular example with satisfying results: the computed error is kept relatively low and exhibits endurance in parameter variation. The success of the presented technique has been clearly recorded in numerous other simulations. Copyright © Taylor & Francis Group, LLC. |
en |
heal.publisher |
TAYLOR & FRANCIS INC |
en |
heal.journalName |
Electromagnetics |
en |
dc.identifier.doi |
10.1080/02726343.2010.513930 |
en |
dc.identifier.isi |
ISI:000282574900001 |
en |
dc.identifier.volume |
30 |
en |
dc.identifier.issue |
7 |
en |
dc.identifier.spage |
565 |
en |
dc.identifier.epage |
573 |
en |