dc.contributor.author |
Christodoulou, CA |
en |
dc.contributor.author |
Gonos, IF |
en |
dc.contributor.author |
Stathopulos, IA |
en |
dc.date.accessioned |
2014-03-01T01:35:39Z |
|
dc.date.available |
2014-03-01T01:35:39Z |
|
dc.date.issued |
2011 |
en |
dc.identifier.issn |
0378-7796 |
en |
dc.identifier.uri |
https://dspace.lib.ntua.gr/xmlui/handle/123456789/21141 |
|
dc.subject |
Circuit models |
en |
dc.subject |
Circuit parameters |
en |
dc.subject |
Genetic algorithm |
en |
dc.subject |
Optimization |
en |
dc.subject |
Simulation |
en |
dc.subject |
Surge arrester |
en |
dc.subject.classification |
Engineering, Electrical & Electronic |
en |
dc.subject.other |
Circuit models |
en |
dc.subject.other |
Circuit parameter |
en |
dc.subject.other |
Current curve |
en |
dc.subject.other |
Current waveforms |
en |
dc.subject.other |
Equivalent circuit model |
en |
dc.subject.other |
Metal oxides |
en |
dc.subject.other |
Peak values |
en |
dc.subject.other |
Residual voltage |
en |
dc.subject.other |
Simulation |
en |
dc.subject.other |
Surge arresters |
en |
dc.subject.other |
Circuit theory |
en |
dc.subject.other |
Electric surges |
en |
dc.subject.other |
Genetic algorithms |
en |
dc.subject.other |
Metallic compounds |
en |
dc.subject.other |
Parameter estimation |
en |
dc.title |
Estimation of the parameters of metal oxide gapless surge arrester equivalent circuit models using genetic algorithm |
en |
heal.type |
journalArticle |
en |
heal.identifier.primary |
10.1016/j.epsr.2011.05.013 |
en |
heal.identifier.secondary |
http://dx.doi.org/10.1016/j.epsr.2011.05.013 |
en |
heal.language |
English |
en |
heal.publicationDate |
2011 |
en |
heal.abstract |
In the present work a genetic algorithm is developed, for the evaluation of the parameters of metal oxide gapless surge arrester circuit models, in order to minimize the error between the computed and the measured (by the manufacturer) peak value of the residual voltage for each given current waveform and level separately. Furthermore, the algorithm is modified in order to minimize the error simultaneously for all the given injected impulse (lightning and switching) current curves. (C) 2011 Elsevier B.V. All rights reserved. |
en |
heal.publisher |
ELSEVIER SCIENCE SA |
en |
heal.journalName |
Electric Power Systems Research |
en |
dc.identifier.doi |
10.1016/j.epsr.2011.05.013 |
en |
dc.identifier.isi |
ISI:000294581300004 |
en |
dc.identifier.volume |
81 |
en |
dc.identifier.issue |
10 |
en |
dc.identifier.spage |
1881 |
en |
dc.identifier.epage |
1886 |
en |