dc.contributor.author |
Tsetseris, L |
en |
dc.contributor.author |
Pantelides, ST |
en |
dc.date.accessioned |
2014-03-01T01:35:53Z |
|
dc.date.available |
2014-03-01T01:35:53Z |
|
dc.date.issued |
2011 |
en |
dc.identifier.issn |
1098-0121 |
en |
dc.identifier.uri |
https://dspace.lib.ntua.gr/xmlui/handle/123456789/21236 |
|
dc.subject.classification |
Physics, Condensed Matter |
en |
dc.subject.other |
MOLECULAR-DYNAMICS |
en |
dc.subject.other |
FULLERENE DIMERS |
en |
dc.subject.other |
SOLAR-CELLS |
en |
dc.subject.other |
AB-INITIO |
en |
dc.subject.other |
CARBON |
en |
dc.subject.other |
FILMS |
en |
dc.subject.other |
C-119 |
en |
dc.subject.other |
HYDROGEN |
en |
dc.subject.other |
C-121 |
en |
dc.subject.other |
MECHANISMS |
en |
dc.title |
Intermolecular bridges and carrier traps in defective C60 crystals |
en |
heal.type |
journalArticle |
en |
heal.identifier.primary |
10.1103/PhysRevB.84.195202 |
en |
heal.identifier.secondary |
http://dx.doi.org/10.1103/PhysRevB.84.195202 |
en |
heal.identifier.secondary |
195202 |
en |
heal.language |
English |
en |
heal.publicationDate |
2011 |
en |
heal.abstract |
Native point defects affect the physical properties of electronic materials and related devices. Here we employ first-principles calculations to address the role of vacancies and self-interstitials in the widely used organic semiconductor C60. We find that several stable defect configurations introduce levels in the energy-band gap of C60 fullerite crystals, creating traps for charge carriers. We also find that while certain metastable point-defect structures bear finite magnetic moments, the lowest-energy defect geometries are nonmagnetic. As a result, point defects may play only a secondary role in the appearance of magnetism in irradiated C60 samples. © 2011 American Physical Society. |
en |
heal.publisher |
AMER PHYSICAL SOC |
en |
heal.journalName |
Physical Review B - Condensed Matter and Materials Physics |
en |
dc.identifier.doi |
10.1103/PhysRevB.84.195202 |
en |
dc.identifier.isi |
ISI:000296865900004 |
en |
dc.identifier.volume |
84 |
en |
dc.identifier.issue |
19 |
en |