Savatinova, I; Tonchev, S; Todorov, R; Venkova, E; Liarokapis, E; Anastassakis, E

dc.contributor.author	Savatinova, I	en
dc.contributor.author	Tonchev, S	en
dc.contributor.author	Todorov, R	en
dc.contributor.author	Venkova, E	en
dc.contributor.author	Liarokapis, E	en
dc.contributor.author	Anastassakis, E	en
dc.date.accessioned	2014-03-01T01:40:00Z
dc.date.available	2014-03-01T01:40:00Z
dc.date.issued	1990	en
dc.identifier.issn	00218979	en
dc.identifier.uri	https://dspace.lib.ntua.gr/xmlui/handle/123456789/23053
dc.title	Polyimide thin-film waveguides: Optical and Raman spectroscopic studies	en
heal.type	journalArticle	en
heal.identifier.primary	10.1063/1.345589	en
heal.identifier.secondary	http://dx.doi.org/10.1063/1.345589	en
heal.publicationDate	1990	en
heal.abstract	Polyimide films deposited on fused quartz, silicon, and ceramic substrates are examined. Waveguide techniques are used to determine the guide modes from which the index of refraction is inferred. Film thicknesses are determined from transmission interferences and, independently, from a luminescence-induced reflection interference pattern. Using a waveguide configuration we also observed and analyzed Raman scattering features in the region above 1000 cm -1.	en
heal.journalName	Journal of Applied Physics	en
dc.identifier.doi	10.1063/1.345589	en
dc.identifier.volume	67	en
dc.identifier.issue	4	en
dc.identifier.spage	2051	en
dc.identifier.epage	2055	en