Stabilized cubic zirconia: A Raman study under uniaxial stress

Cai, J; Raptis, YS; Anastassakis, E

dc.contributor.author	Cai, J	en
dc.contributor.author	Raptis, YS	en
dc.contributor.author	Anastassakis, E	en
dc.date.accessioned	2014-03-01T01:41:55Z
dc.date.available	2014-03-01T01:41:55Z
dc.date.issued	1993	en
dc.identifier.issn	00036951	en
dc.identifier.uri	https://dspace.lib.ntua.gr/xmlui/handle/123456789/23672
dc.title	Stabilized cubic zirconia: A Raman study under uniaxial stress	en
heal.type	journalArticle	en
heal.identifier.primary	10.1063/1.109233	en
heal.identifier.secondary	http://dx.doi.org/10.1063/1.109233	en
heal.publicationDate	1993	en
heal.abstract	Yttria-stabilized cubic zirconia has been studied at 300 K by use of Raman spectroscopy under uniaxial stress along the [001] and [111] directions. The main effects observed are the frequency shifts of the F2g-type Raman band at ∼610 cm-1 which vary linearly with the applied stress and tend to increase with Y2O3 concentration. Effective deformation potentials are determined for the F2g band. These potentials are necessary for strain characterization of stabilized cubic zirconia, in buffer or epitaxial film configurations. Polycrystalline yttria-stabilized tetragonal zirconia is likewise studied.	en
heal.journalName	Applied Physics Letters	en
dc.identifier.doi	10.1063/1.109233	en
dc.identifier.volume	62	en
dc.identifier.issue	22	en
dc.identifier.spage	2781	en
dc.identifier.epage	2783	en