dc.contributor.author |
Zergioti, I |
en |
dc.contributor.author |
Fotakis, C |
en |
dc.contributor.author |
Haidemenopoulos, G |
en |
dc.date.accessioned |
2014-03-01T01:45:36Z |
|
dc.date.available |
2014-03-01T01:45:36Z |
|
dc.date.issued |
1997 |
en |
dc.identifier.uri |
https://dspace.lib.ntua.gr/xmlui/handle/123456789/24647 |
|
dc.subject |
Electrical Resistance |
en |
dc.subject |
Excimer Laser |
en |
dc.subject |
Grain Size |
en |
dc.subject |
Pulsed Laser Deposition |
en |
dc.subject |
Residual Stress |
en |
dc.subject |
Scanning Electron Microscopy |
en |
dc.subject |
Structural Properties |
en |
dc.subject |
Transmission Electron Microscopy |
en |
dc.subject |
X Ray Diffraction |
en |
dc.subject |
X Ray Diffractometry |
en |
dc.title |
Growth of TiB 2 and TiC coatings using pulsed laser deposition |
en |
heal.type |
journalArticle |
en |
heal.identifier.primary |
10.1016/S0040-6090(97)00128-4 |
en |
heal.identifier.secondary |
http://dx.doi.org/10.1016/S0040-6090(97)00128-4 |
en |
heal.publicationDate |
1997 |
en |
heal.abstract |
Refractory coatings of TiC and TiB2 have been grown by pulsed laser deposition on Si(100) and on X155 steel at various substrate temperatures ranging from 40°C–650°C. A pulsed KrF excimer laser was used with the deposition chamber at a base pressure of 10−6 mbar. The morphology and structure of the films, studied with scanning electron microscopy (SEM), X-ray diffractometry (XRD) |
en |
heal.journalName |
Thin Solid Films |
en |
dc.identifier.doi |
10.1016/S0040-6090(97)00128-4 |
en |