Multiple Experiment Environments for Testing

Lentz, KP; Manolakos, ES; Czeck, E; Heller, J

dc.contributor.author	Lentz, KP	en
dc.contributor.author	Manolakos, ES	en
dc.contributor.author	Czeck, E	en
dc.contributor.author	Heller, J	en
dc.date.accessioned	2014-03-01T01:46:04Z
dc.date.available	2014-03-01T01:46:04Z
dc.date.issued	1997	en
dc.identifier.issn	09238174	en
dc.identifier.uri	https://dspace.lib.ntua.gr/xmlui/handle/123456789/24832
dc.relation.uri	http://www.scopus.com/inward/record.url?eid=2-s2.0-0031367293&partnerID=40&md5=61867a67065bedc1f91dc9f67dd636db	en
dc.subject	Concurrent fault simulation	en
dc.subject	Interactive experimentation	en
dc.subject	Multiple stuck-at	en
dc.subject	Scenario	en
dc.subject.other	Algorithms	en
dc.subject.other	Computer simulation	en
dc.subject.other	Data storage equipment	en
dc.subject.other	Digital integrated circuits	en
dc.subject.other	Logic circuits	en
dc.subject.other	Digital logic simulators	en
dc.subject.other	Interactive experimentation	en
dc.subject.other	Multiple domain concurrent simulation	en
dc.subject.other	Integrated circuit testing	en
dc.title	Multiple Experiment Environments for Testing	en
heal.type	journalArticle	en
heal.publicationDate	1997	en
heal.abstract	Concurrent simulation (CS) has been used successfully as a replacement for serial simulation. Based on storing differences from experiments, CS saves storage, speeds up simulation time and allows excellent internal observation of events. In this paper, we introduce Multiple Domain Concurrent Simulation (MDCS) which like concurrent simulation, maintains efficiency by only simulating differences. MDCS also allows experiments to interact with one another and create new experiments through the use of domains. These experiments can be traced and observed at any point, providing insight into the origin and causes of new experiments. While many experiment scenarios can be created, MDCS uses dynamic spawning and experiment compression rather than explicit enumeration to ensure that the number of experiment scenarios does not become exhaustive. MDCS does not require any pre-analysis or additions to the circuit under test. Providing this capability in digital logic simulators allows more test cases to be run in less time. MDCS gives the exact location and causes of every experiment behavior and can be used to track the signature paths of test patterns for coverage analysis. We will describe the algorithms for MDCS, discuss the rules for propagating experiments and describe the concepts of domains for making dynamic interactions possible. We will report on the effectiveness of MDCS for attacking an exhaustive simulation problem such as Multiple Stuck-at Fault simulations for digital logic. Finally, the applicability of MDCS for more general experimentation of digital logic systems will be discussed.	en
heal.journalName	Journal of Electronic Testing: Theory and Applications (JETTA)	en
dc.identifier.volume	11	en
dc.identifier.issue	3	en
dc.identifier.spage	247	en
dc.identifier.epage	262	en