Study of the ambient optical recording dynamics on sputtered indium oxide thin films

Moschovis, K; Gagaoudakis, E; Chatzitheodoridis, E; Kiriakidis, G; Mailis, S; Tzamali, E; Vainos, N; Fritzsche, H

dc.contributor.author	Moschovis, K	en
dc.contributor.author	Gagaoudakis, E	en
dc.contributor.author	Chatzitheodoridis, E	en
dc.contributor.author	Kiriakidis, G	en
dc.contributor.author	Mailis, S	en
dc.contributor.author	Tzamali, E	en
dc.contributor.author	Vainos, N	en
dc.contributor.author	Fritzsche, H	en
dc.date.accessioned	2014-03-01T01:46:56Z
dc.date.available	2014-03-01T01:46:56Z
dc.date.issued	1998	en
dc.identifier.uri	https://dspace.lib.ntua.gr/xmlui/handle/123456789/25108
dc.subject	Electric Conductivity	en
dc.subject	Magnetron Sputtering	en
dc.subject	Optical Recording	en
dc.subject	Thin Film	en
dc.subject	Ultraviolet	en
dc.title	Study of the ambient optical recording dynamics on sputtered indium oxide thin films	en
heal.type	journalArticle	en
heal.identifier.primary	10.1007/s003390050727	en
heal.identifier.secondary	http://dx.doi.org/10.1007/s003390050727	en
heal.publicationDate	1998	en
heal.abstract	2 O3) thin films, grown by dc magnetron sputtering, using ultraviolet laser radiation at 325 nm, is investigated. Simultaneous measurements of the recording efficiency and electrical conductivity changes, under ambient conditions, prove that there is a strong relation between the two actions, and measurements of the recording efficiency with respect to the film conductivity history and temperature provide evidence for the presence of	en
heal.journalName	Applied Physics A-materials Science & Processing	en
dc.identifier.doi	10.1007/s003390050727	en