Modelling of dielectric cavity structures using multiresolution time-domain analysis

Robertson, R; Tentzeris, E; Krumpholz, M; Katehi, LPB

dc.contributor.author	Robertson, R	en
dc.contributor.author	Tentzeris, E	en
dc.contributor.author	Krumpholz, M	en
dc.contributor.author	Katehi, LPB	en
dc.date.accessioned	2014-03-01T01:47:25Z
dc.date.available	2014-03-01T01:47:25Z
dc.date.issued	1998	en
dc.identifier.issn	08943370	en
dc.identifier.uri	https://dspace.lib.ntua.gr/xmlui/handle/123456789/25202
dc.relation.uri	http://www.scopus.com/inward/record.url?eid=2-s2.0-0031647961&partnerID=40&md5=4842ebcacb95b7d65a9074c0ad19397e	en
dc.subject.other	Estimation	en
dc.subject.other	Mathematical models	en
dc.subject.other	Maxwell equations	en
dc.subject.other	Perturbation techniques	en
dc.subject.other	Time domain analysis	en
dc.subject.other	Wavelet transforms	en
dc.subject.other	Multiresolution time domain (MRTD) analysis	en
dc.subject.other	Cavity resonators	en
dc.title	Modelling of dielectric cavity structures using multiresolution time-domain analysis	en
heal.type	journalArticle	en
heal.publicationDate	1998	en
heal.abstract	Multiresolution time domain (MRTD) analysis is applied directly to Maxwell's equations to model inhomogeneous dielectric material. In our approach, scaling and wavelet functions are used as a complete basis for the method of moments. The MRTD scheme is used to analyze different types of resonant cavity structures with varying dielectric perturbations in one, two and three dimensions. The results presented here agree very well with those obtained by FDTD, FEM and integral equation methods. MRTD allows for considerable savings in memory and computation time in comparison to FDTD, while maintaining the same accuracy of the results. © 1998 John Wiley & Sons, Ltd.	en
heal.journalName	International Journal of Numerical Modelling: Electronic Networks, Devices and Fields	en
dc.identifier.volume	11	en
dc.identifier.issue	1	en
dc.identifier.spage	55	en
dc.identifier.epage	68	en