dc.contributor.author |
Logothetidis, S |
en |
dc.contributor.author |
Charitidis, C |
en |
dc.date.accessioned |
2014-03-01T01:47:54Z |
|
dc.date.available |
2014-03-01T01:47:54Z |
|
dc.date.issued |
1999 |
en |
dc.identifier.uri |
https://dspace.lib.ntua.gr/xmlui/handle/123456789/25366 |
|
dc.subject |
Amorphous Carbon |
en |
dc.subject |
Elastic Modulus |
en |
dc.subject |
Elastic Properties |
en |
dc.subject |
Ion Bombardment |
en |
dc.subject |
Spectroscopic Ellipsometry |
en |
dc.subject |
Thin Film |
en |
dc.title |
Elastic properties of hydrogen-free amorphous carbon thin films and their relation with carbon–carbon bonding |
en |
heal.type |
journalArticle |
en |
heal.identifier.primary |
10.1016/S0040-6090(99)00425-3 |
en |
heal.identifier.secondary |
http://dx.doi.org/10.1016/S0040-6090(99)00425-3 |
en |
heal.publicationDate |
1999 |
en |
heal.abstract |
The hardness and elastic modulus of thin, free of hydrogen, amorphous carbon (a-C) films, deposited with sputtering, were measured using the nanoindentation, conventional and continuous stiffness measurements (CSM), depth-sensing techniques. It is shown that the CSM technique is quite efficient in characterizing very thin (∼30 nm) a-C films. The sp2 and sp3 content and thickness of a-C films were determined |
en |
heal.journalName |
Thin Solid Films |
en |
dc.identifier.doi |
10.1016/S0040-6090(99)00425-3 |
en |