dc.contributor.author | Rogers, C | en |
dc.contributor.author | Goodchild, D | en |
dc.contributor.author | Baulcomb, R | en |
dc.contributor.author | Butler, M | en |
dc.contributor.author | Hoyle, P | en |
dc.contributor.author | Kanellopoulos, S | en |
dc.contributor.author | Clements, S | en |
dc.contributor.author | Pugh, B | en |
dc.date.accessioned | 2014-03-01T01:48:02Z | |
dc.date.available | 2014-03-01T01:48:02Z | |
dc.date.issued | 1999 | en |
dc.identifier.uri | https://dspace.lib.ntua.gr/xmlui/handle/123456789/25387 | |
dc.subject | Electron Beam | en |
dc.title | High perfection chirped grating phase masks by electron-beam definition | en |
heal.type | journalArticle | en |
heal.identifier.primary | 10.1116/1.590983 | en |
heal.identifier.secondary | http://dx.doi.org/10.1116/1.590983 | en |
heal.publicationDate | 1999 | en |
heal.journalName | Journal of Vacuum Science & Technology B: Microelectronics and Nanometer Structures | en |
dc.identifier.doi | 10.1116/1.590983 | en |
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