Potential measurements on electric contacts - An experimental investigation

Karagiannopoulos, CG; Agoris, DP; Psomopoulos, CS; Bourkas, PD

dc.contributor.author	Karagiannopoulos, CG	en
dc.contributor.author	Agoris, DP	en
dc.contributor.author	Psomopoulos, CS	en
dc.contributor.author	Bourkas, PD	en
dc.date.accessioned	2014-03-01T01:50:08Z
dc.date.available	2014-03-01T01:50:08Z
dc.date.issued	2000	en
dc.identifier.issn	0263-2241	en
dc.identifier.uri	https://dspace.lib.ntua.gr/xmlui/handle/123456789/26001
dc.subject	electrical contacts	en
dc.subject	A/D converter	en
dc.subject	digital measurements for evaluation	en
dc.subject.classification	Engineering, Multidisciplinary	en
dc.subject.classification	Instruments & Instrumentation	en
dc.title	Potential measurements on electric contacts - An experimental investigation	en
heal.type	journalArticle	en
heal.language	English	en
heal.publicationDate	2000	en
heal.abstract	Tn this work, an experimental investigation is attempted, concerning electrical contacts evaluation through analog to digital measurements and physical interpretations of the dominant phenomena are presented. The circuit employed is in agreement with IEC0660 specifications concerning switch overheat tests. The commercial switches used for the measurements, had the following nominal characteristics: isolators 20 kV/200 A, fuse isolators 20 kV/65 A and isolators 500 V/100 A. The measurements were performed through AID converters with a sampling frequency of 4 MSPS, and waveforms of the voltage drop and current were obtained for the nominal current values of the specimens. Current-voltage plots (I-V plots) by time elimination corresponding to a part of the waveforms are also presented. Further analysis of the data obtained is performed and it can easily be concluded that the thickness of the interfacial layer determines the conduction mechanisms. In the case of contacts in advanced degradation the current conduction is mainly attributed to field emission or field ionization processes. The above dominant effects characterize high rates of electronic conduction via stationary metal contacts at a state where linear behavior has ceased and instabilities have developed. The data which resulted lead to an effective test for industrial switching contacts and could aid technoeconomical selections. (C) 2000 Elsevier Science Ltd. All rights reserved.	en
heal.publisher	ELSEVIER SCI LTD	en
heal.journalName	MEASUREMENT	en
dc.identifier.isi	ISI:000087156500007	en
dc.identifier.volume	27	en
dc.identifier.issue	1	en
dc.identifier.spage	61	en
dc.identifier.epage	69	en