dc.contributor.author |
Gonos, IF |
en |
dc.contributor.author |
Ilia, NC |
en |
dc.contributor.author |
Kontargyri, VT |
en |
dc.contributor.author |
Stathopulos, IA |
en |
dc.date.accessioned |
2014-03-01T01:52:57Z |
|
dc.date.available |
2014-03-01T01:52:57Z |
|
dc.date.issued |
2003 |
en |
dc.identifier.uri |
https://dspace.lib.ntua.gr/xmlui/handle/123456789/26796 |
|
dc.relation.uri |
http://www.scopus.com/inward/record.url?eid=2-s2.0-4944260187&partnerID=40&md5=79d79a8993dc3d5f8a6a1763840c1d84 |
en |
dc.subject |
Cap-and-pin type porcelain insulator |
en |
dc.subject |
Genetic algorithm |
en |
dc.subject |
Insulator string |
en |
dc.subject |
Stray capacitance |
en |
dc.subject.other |
Electric conductors |
en |
dc.subject.other |
Electric insulators |
en |
dc.subject.other |
Electric potential |
en |
dc.subject.other |
Electric transformers |
en |
dc.subject.other |
Genetic algorithms |
en |
dc.subject.other |
Optimization |
en |
dc.subject.other |
Porcelain |
en |
dc.subject.other |
Power transmission |
en |
dc.subject.other |
Voltmeters |
en |
dc.subject.other |
Cap-and-pin type porcelain insulator |
en |
dc.subject.other |
Insulator string |
en |
dc.subject.other |
Stray capacitance |
en |
dc.subject.other |
Voltage distribution |
en |
dc.subject.other |
Capacitance |
en |
dc.title |
Application of a genetic algorithm for calculating the capacitances on an insulator string |
en |
heal.type |
journalArticle |
en |
heal.publicationDate |
2003 |
en |
heal.abstract |
The aim of this paper is the study of the distribution of the voltage along an insulator string. Insulator strings are used for the suspension of overhead transmission lines. This paper presents a method for the calculation of the capacitances on an insulator string using genetic algorithm. The simulation results have been compared with experimental results, which have been obtained in the High Voltage Laboratory of the National Technical University of Athens. The good agreement between experimental and computed results is a very strong indication for the validity and the correctness of the developed model. |
en |
heal.publisher |
World Scientific and Engineering Academy and Society |
en |
heal.journalName |
Computational Methods in Circuits and Systems Applications |
en |
dc.identifier.spage |
333 |
en |
dc.identifier.epage |
336 |
en |