Micro-Raman scattering as a non-destructive tool in the investigation of solids and stress

Vamvakoussis, A; Tsananas, G; Antonatos, A; Siakavellas, M; Prassianakis, J

dc.contributor.author	Vamvakoussis, A	en
dc.contributor.author	Tsananas, G	en
dc.contributor.author	Antonatos, A	en
dc.contributor.author	Siakavellas, M	en
dc.contributor.author	Prassianakis, J	en
dc.date.accessioned	2014-03-01T01:53:00Z
dc.date.available	2014-03-01T01:53:00Z
dc.date.issued	2003	en
dc.identifier.issn	13542575	en
dc.identifier.uri	https://dspace.lib.ntua.gr/xmlui/handle/123456789/26816
dc.relation.uri	http://www.scopus.com/inward/record.url?eid=2-s2.0-0037385208&partnerID=40&md5=83dfee29b0ee4cb50284efb367064650	en
dc.subject.other	Raman spectroscopy	en
dc.subject.other	Semiconductor devices	en
dc.subject.other	Stress analysis	en
dc.subject.other	Superlattices	en
dc.subject.other	Micro-Raman scattering	en
dc.subject.other	Nondestructive examination	en
dc.title	Micro-Raman scattering as a non-destructive tool in the investigation of solids and stress	en
heal.type	journalArticle	en
heal.publicationDate	2003	en
heal.abstract	In this article the authors present the main advantages of the micro-Roman scattering (MRS) technique in order to perform non-destructively, sensitive, fast and accurate stress and strain measurements in material systems. In order to check the accuracy of this method, a set of Phonon Deformation Potentials (PDPs) was used, in analysing previously reported Roman data of free-standing ZnS/ZnTe and ZnS/ZnSe superlattices (SLs). In addition, published micro-Roman spectroscopy data concerning micromechanical semiconductor devices (structures) were used in order to evaluate quantitatively their stress (strain) components, presupposing a stress or strain (uniaxial or biaxial) model.	en
heal.journalName	Insight: Non-Destructive Testing and Condition Monitoring	en
dc.identifier.volume	45	en
dc.identifier.issue	4	en
dc.identifier.spage	258	en
dc.identifier.epage	262	en