Surface deformation and ferroelectric domain switching induced by a force microscope tip on a La-modified PbTiO3 thin film

Labardi, M; Polop, C; Likodimos, V; Pardi, L; Allegrini, M; Vasco, E; Zaldo, C

dc.contributor.author	Labardi, M	en
dc.contributor.author	Polop, C	en
dc.contributor.author	Likodimos, V	en
dc.contributor.author	Pardi, L	en
dc.contributor.author	Allegrini, M	en
dc.contributor.author	Vasco, E	en
dc.contributor.author	Zaldo, C	en
dc.date.accessioned	2014-03-01T01:53:04Z
dc.date.available	2014-03-01T01:53:04Z
dc.date.issued	2003	en
dc.identifier.issn	00036951	en
dc.identifier.uri	https://dspace.lib.ntua.gr/xmlui/handle/123456789/26836
dc.subject.other	Chemical modification	en
dc.subject.other	Image analysis	en
dc.subject.other	Lead compounds	en
dc.subject.other	Stress analysis	en
dc.subject.other	Surface phenomena	en
dc.subject.other	Ferroelectric domain switching	en
dc.subject.other	Ferroelectric thin films	en
dc.title	Surface deformation and ferroelectric domain switching induced by a force microscope tip on a La-modified PbTiO3 thin film	en
heal.type	journalArticle	en
heal.identifier.primary	10.1063/1.1606100	en
heal.identifier.secondary	http://dx.doi.org/10.1063/1.1606100	en
heal.publicationDate	2003	en
heal.abstract	Surface deformation and ferroelectric domain switching induced by a force microscope tip on a La-modified PbTiO3 thin film was studied. Polarization switching of the domains comprising the deformed region demonstrated the possibility of using scanning force microscopy (SFM) as a nanoscale tool for imaging phase transitions. It was found that if loading forces are higher than a threshold value, thin film characterization becomes invasive.	en
heal.journalName	Applied Physics Letters	en
dc.identifier.doi	10.1063/1.1606100	en
dc.identifier.volume	83	en
dc.identifier.issue	10	en
dc.identifier.spage	2028	en
dc.identifier.epage	2030	en