dc.contributor.author |
Brodoceanu, D |
en |
dc.contributor.author |
Manousaki, A |
en |
dc.contributor.author |
Zergioti, I |
en |
dc.contributor.author |
Klini, A |
en |
dc.contributor.author |
Dinescu, M |
en |
dc.contributor.author |
Fotakis, C |
en |
dc.date.accessioned |
2014-03-01T01:53:22Z |
|
dc.date.available |
2014-03-01T01:53:22Z |
|
dc.date.issued |
2004 |
en |
dc.identifier.uri |
https://dspace.lib.ntua.gr/xmlui/handle/123456789/26981 |
|
dc.subject |
Atomic Force Microscopy |
en |
dc.subject |
Pulsed Laser Deposition |
en |
dc.subject |
Scanning Electron Microscopy |
en |
dc.subject |
Thin Film |
en |
dc.subject |
X Ray Diffraction |
en |
dc.title |
Growth of polycrystalline La 0.5 Sr 0.5 CoO 3 films by femtosecond pulsed laser deposition |
en |
heal.type |
journalArticle |
en |
heal.identifier.primary |
10.1007/s00339-004-2824-6 |
en |
heal.identifier.secondary |
http://dx.doi.org/10.1007/s00339-004-2824-6 |
en |
heal.publicationDate |
2004 |
en |
heal.abstract |
In this paper we present the growth of La 0.5Sr 0.5CoO 3 (LSCO) films on MgO, quartz, and silicon substrates by pulsed laser deposition (PLD) using a Ti : sapphire laser (50 fs, 800 nm wavelength). The morphology and the structure of the films were studied by X-ray diffraction, atomic force microscopy, and scanning electron microscopy. The films were polycrystalline and exhibit a good |
en |
heal.journalName |
Applied Physics A-materials Science & Processing |
en |
dc.identifier.doi |
10.1007/s00339-004-2824-6 |
en |