Memory effects in EM emission during uniaxial deformation of dielectric crystalline materials

Hadjicontis, V; Tombras, GS; Ninos, D; Mavromatou, C

dc.contributor.author	Hadjicontis, V	en
dc.contributor.author	Tombras, GS	en
dc.contributor.author	Ninos, D	en
dc.contributor.author	Mavromatou, C	en
dc.date.accessioned	2014-03-01T01:54:28Z
dc.date.available	2014-03-01T01:54:28Z
dc.date.issued	2005	en
dc.identifier.issn	1545598X	en
dc.identifier.uri	https://dspace.lib.ntua.gr/xmlui/handle/123456789/27398
dc.subject	Acoustic emission	en
dc.subject	Earthquake precursors	en
dc.subject	Electromagnetic (EM) emission	en
dc.subject	Kaiser effect	en
dc.subject	Microfracturing electrification	en
dc.subject.other	Acoustic waves	en
dc.subject.other	Crystalline materials	en
dc.subject.other	Deformation	en
dc.subject.other	Earthquakes	en
dc.subject.other	Electromagnetic waves	en
dc.subject.other	Stresses	en
dc.subject.other	Earthquake precursors	en
dc.subject.other	Electrommagnetic (EM) emission	en
dc.subject.other	Kaiser effect	en
dc.subject.other	Microfracturing electrification	en
dc.subject.other	Dielectric materials	en
dc.title	Memory effects in EM emission during uniaxial deformation of dielectric crystalline materials	en
heal.type	journalArticle	en
heal.identifier.primary	10.1109/LGRS.2004.842472	en
heal.identifier.secondary	http://dx.doi.org/10.1109/LGRS.2004.842472	en
heal.publicationDate	2005	en
heal.abstract	It is known that during uniaxial compression of dielectric crystalline materials, acoustic and electromagnetic (EM) emission is detected. Such emissions are of particular interest, since they are related to the physical processes taking place during the preparation stage of an earthquake. In this letter, we report recent experimental results on the memory effects observed in the EM emission during successive cyclic mechanical loading-unloading of LiF crystal samples in a similar fashion, as it has been described by the so-called ""Kaiser effect,"" i.e., the memory effect for the acoustic emission, and we discuss on a conceptual explanation. © 2005 IEEE.	en
heal.journalName	IEEE Geoscience and Remote Sensing Letters	en
dc.identifier.doi	10.1109/LGRS.2004.842472	en
dc.identifier.volume	2	en
dc.identifier.issue	2	en
dc.identifier.spage	118	en
dc.identifier.epage	120	en