Structured light scanners 03/02/2011: Working principles, performance and accuracy

Georgopoulos, A; Ioannidis, C; Valanis, A

dc.contributor.author	Georgopoulos, A	en
dc.contributor.author	Ioannidis, C	en
dc.contributor.author	Valanis, A	en
dc.date.accessioned	2014-03-01T02:04:08Z
dc.date.available	2014-03-01T02:04:08Z
dc.date.issued	2011	en
dc.identifier.issn	15669076	en
dc.identifier.uri	https://dspace.lib.ntua.gr/xmlui/handle/123456789/29391
dc.relation.uri	http://www.scopus.com/inward/record.url?eid=2-s2.0-79957476600&partnerID=40&md5=02a3beccd62425deef3db4b6e1861b90	en
dc.title	Structured light scanners 03/02/2011: Working principles, performance and accuracy	en
heal.type	journalArticle	en
heal.publicationDate	2011	en
heal.abstract	The measurement principle of structured light scanners is based on detecting the deformation of a pattern of light projected onto the surface of an object. The pattern may be one dimensional line or two dimensional. When a line pattern is used, the line is swept over the surface one strip at a time. Faster and more versatile is the projection of many stripes at once, allowing the simultaneous acquisition of multiple samples. A camera records the deformation of the pattern and a complex algorithm calculates the distance to points on the lines. The system comprises lowcost, off-the-shelf hardware. Two Canon 450D digital SLR cameras with 12megapixels in the image plane are mounted on a rigid base the width of which may be adapted to size of object and distance. The use of polarizing filters for the projector and cameras is recommended.	en
heal.journalName	GIM International	en
dc.identifier.volume	25	en
dc.identifier.issue	2	en