dc.contributor.author |
Athanassopoulou, MD |
en |
dc.contributor.author |
Mergos, JA |
en |
dc.contributor.author |
Palaiologopoulou, MD |
en |
dc.contributor.author |
Argyropoulos, TG |
en |
dc.contributor.author |
Dervos, CT |
en |
dc.date.accessioned |
2014-03-01T02:14:41Z |
|
dc.date.available |
2014-03-01T02:14:41Z |
|
dc.date.issued |
2012 |
en |
dc.identifier.issn |
00406090 |
en |
dc.identifier.uri |
https://dspace.lib.ntua.gr/xmlui/handle/123456789/30089 |
|
dc.subject |
Annealing |
en |
dc.subject |
Cadmium selenide |
en |
dc.subject |
Electrodeposition |
en |
dc.subject |
Interface |
en |
dc.subject |
Ohmic contacts |
en |
dc.subject |
Rectifiers |
en |
dc.subject |
Semiconductors |
en |
dc.subject |
Thin films |
en |
dc.subject.other |
Barrier layers |
en |
dc.subject.other |
Bath temperatures |
en |
dc.subject.other |
Cadmium selenides |
en |
dc.subject.other |
Cathodic electrodeposition |
en |
dc.subject.other |
Cdse |
en |
dc.subject.other |
CdSe films |
en |
dc.subject.other |
CdSe thin films |
en |
dc.subject.other |
Cubic structure |
en |
dc.subject.other |
Ni substrates |
en |
dc.subject.other |
Nitrogen atmospheres |
en |
dc.subject.other |
Nitrogen gas |
en |
dc.subject.other |
Rectification properties |
en |
dc.subject.other |
Rectifying properties |
en |
dc.subject.other |
Structural and electrical properties |
en |
dc.subject.other |
Sulphate solutions |
en |
dc.subject.other |
Thermal-annealing |
en |
dc.subject.other |
Zinc blende |
en |
dc.subject.other |
Annealing |
en |
dc.subject.other |
Cadmium alloys |
en |
dc.subject.other |
Electric properties |
en |
dc.subject.other |
Electric rectifiers |
en |
dc.subject.other |
Electrodeposition |
en |
dc.subject.other |
Film preparation |
en |
dc.subject.other |
Interfaces (materials) |
en |
dc.subject.other |
Ohmic contacts |
en |
dc.subject.other |
Scanning electron microscopy |
en |
dc.subject.other |
Semiconducting films |
en |
dc.subject.other |
Semiconductor materials |
en |
dc.subject.other |
Thin films |
en |
dc.subject.other |
X ray diffraction |
en |
dc.subject.other |
Cadmium compounds |
en |
dc.title |
Structural and electrical properties of annealed CdSe films on Ni substrate |
en |
heal.type |
journalArticle |
en |
heal.identifier.primary |
10.1016/j.tsf.2012.06.071 |
en |
heal.identifier.secondary |
http://dx.doi.org/10.1016/j.tsf.2012.06.071 |
en |
heal.publicationDate |
2012 |
en |
heal.abstract |
Preparation and characterization of CdSe thin film semiconductors, prepared by cathodic electrodeposition from an acid sulphate solution (CdSO4-SeO2) before and after thermal treatment in nitrogen atmosphere, were investigated. The effect of the bath temperature and how it affects the cadmium selenide (CdSe) deposits were studied. The formation of compact barrier layers of zinc blende CdSe was attained. Scanning electron microscopy and X-ray diffraction patterns present a remarkably intense cubic structure, even after thermal treatment. The Ni/CdSe/Au structure may exhibit rectifying properties depending on the temperature during the electrodeposition. Thermal annealing in nitrogen gas increases the conductivity of CdSe and intensifies the rectification properties of the Ni/CdSe/Au structure. © 2012 Elsevier B.V. All rights reserved. |
en |
heal.journalName |
Thin Solid Films |
en |
dc.identifier.doi |
10.1016/j.tsf.2012.06.071 |
en |
dc.identifier.volume |
520 |
en |
dc.identifier.issue |
21 |
en |
dc.identifier.spage |
6515 |
en |
dc.identifier.epage |
6520 |
en |