Analysis of an aperture-coupled two-dimensional conductor

Karatheodorou Konstantinos, A; Uzanoglu Nikolaos, K; Kaklamani Dimitra, I

dc.contributor.author	Karatheodorou Konstantinos, A	en
dc.contributor.author	Uzanoglu Nikolaos, K	en
dc.contributor.author	Kaklamani Dimitra, I	en
dc.date.accessioned	2014-03-01T02:41:10Z
dc.date.available	2014-03-01T02:41:10Z
dc.date.issued	1996	en
dc.identifier.uri	https://dspace.lib.ntua.gr/xmlui/handle/123456789/30405
dc.subject.other	Boundary conditions	en
dc.subject.other	Circular waveguides	en
dc.subject.other	Eigenvalues and eigenfunctions	en
dc.subject.other	Electromagnetic field effects	en
dc.subject.other	Finite difference method	en
dc.subject.other	Finite element method	en
dc.subject.other	Fourier transforms	en
dc.subject.other	Integral equations	en
dc.subject.other	Abstract only	en
dc.subject.other	Aperture coupled two dimensional conductor	en
dc.subject.other	Point matching techniques	en
dc.subject.other	Microstrip lines	en
dc.title	Analysis of an aperture-coupled two-dimensional conductor	en
heal.type	conferenceItem	en
heal.identifier.primary	10.1109/AEM.1996.873144	en
heal.identifier.secondary	http://dx.doi.org/10.1109/AEM.1996.873144	en
heal.publicationDate	1996	en
heal.abstract	A semi-analytical method was employed in the electromagnetic analysis of a two-dimensional conductor at the presence of an aperture. The electromagnetic fields in the region of thick walls of the aperture were expanded in terms of the circular waveguide eigenfunctions, while the fields in the other regions were expressed in the frequency domain through their Fourier transforms. By imposing the boundary conditions on the upper and lower aperture surfaces and the conductor surface, a system of three coupled two-dimensional integral equations was derived in terms of the transverse electric field components on the apertures surface and of the conductivity currents induced on the conductor surface.	en
heal.publisher	IEEE	en
heal.journalName	Trans Black Sea Region Symposium on Applied Electromagnetism	en
dc.identifier.doi	10.1109/AEM.1996.873144	en