Free electron energy during the aging of an organic dielectric under switching impulse voltages

Karagiannopoulos, CG; Bourkas, PD; Agoris, DP; Psomopoulos, CS

dc.contributor.author	Karagiannopoulos, CG	en
dc.contributor.author	Bourkas, PD	en
dc.contributor.author	Agoris, DP	en
dc.contributor.author	Psomopoulos, CS	en
dc.date.accessioned	2014-03-01T02:41:32Z
dc.date.available	2014-03-01T02:41:32Z
dc.date.issued	1998	en
dc.identifier.issn	01642006	en
dc.identifier.uri	https://dspace.lib.ntua.gr/xmlui/handle/123456789/30520
dc.subject	Electric Field	en
dc.subject	Environmental Temperature	en
dc.subject	Impact Ionization	en
dc.subject	Partial Discharge	en
dc.subject.other	Aging of materials	en
dc.subject.other	Electric field effects	en
dc.subject.other	Electric potential	en
dc.subject.other	Electrons	en
dc.subject.other	Free energy	en
dc.subject.other	Partial discharges	en
dc.subject.other	Switching impulse voltages	en
dc.subject.other	Dielectric materials	en
dc.title	Free electron energy during the aging of an organic dielectric under switching impulse voltages	en
heal.type	conferenceItem	en
heal.identifier.primary	10.1109/ELINSL.1998.694842	en
heal.identifier.secondary	http://dx.doi.org/10.1109/ELINSL.1998.694842	en
heal.publicationDate	1998	en
heal.abstract	In this work, an experimental approach of the electronic phenomena during the ageing of a metal-dielectric-metal model is performed, under the application of high impulse voltages of the form 250/2500 μs. The outbreak of partial discharges at the above system may come as the result of impact ionization effect, and plays a very important role in the dielectric ageing procedure. The experimental results show an exponential increase of the free electron energy with the applied electric field, as a direct implication of the electrons avalanche mechanism. The above energy involved with the partial discharges depends on the environment temperature (partial discharges enhanced by temperature).	en
heal.publisher	IEEE, Piscataway, NJ, United States	en
heal.journalName	Conference Record of IEEE International Symposium on Electrical Insulation	en
dc.identifier.doi	10.1109/ELINSL.1998.694842	en
dc.identifier.volume	2	en
dc.identifier.spage	499	en
dc.identifier.epage	502	en