Investigation of the effect of mutual coupling of grounding conductors

Lorentzou, MI; Hatziargyriou, ND

dc.contributor.author	Lorentzou, MI	en
dc.contributor.author	Hatziargyriou, ND	en
dc.date.accessioned	2014-03-01T02:41:33Z
dc.date.available	2014-03-01T02:41:33Z
dc.date.issued	1998	en
dc.identifier.uri	https://dspace.lib.ntua.gr/xmlui/handle/123456789/30523
dc.subject	Electromagnetic Transients	en
dc.subject	High Frequency	en
dc.subject	Mutual Coupling	en
dc.subject	Low Frequency	en
dc.subject.other	Electric excitation	en
dc.subject.other	Electric fault currents	en
dc.subject.other	Electric grounding	en
dc.subject.other	Electric impedance	en
dc.subject.other	Frequency domain analysis	en
dc.subject.other	Mathematical models	en
dc.subject.other	Numerical methods	en
dc.subject.other	Time domain analysis	en
dc.subject.other	Transients	en
dc.subject.other	Transmission line theory	en
dc.subject.other	Electromagnetic transients program	en
dc.subject.other	Grounding system conductors	en
dc.subject.other	Electric conductors	en
dc.title	Investigation of the effect of mutual coupling of grounding conductors	en
heal.type	conferenceItem	en
heal.identifier.primary	10.1109/MELCON.1998.692471	en
heal.identifier.secondary	http://dx.doi.org/10.1109/MELCON.1998.692471	en
heal.publicationDate	1998	en
heal.abstract	This paper investigates the effect of mutual couplings between grounding system conductors, in the response of the system. As these couplings become important as shorter the distance between the conductors, large or spanned grounding systems were not examined. ElectroMagnetic Transients Program, has been used for grounding system response calculation, under fast transient conditions or low frequency fault current excitation. Results show that it is essential to consider mutual couplings effects, especially when the system is concentrated, or the excitation source includes high frequency components.	en
heal.publisher	IEEE, Piscataway, NJ, United States	en
heal.journalName	Proceedings of the Mediterranean Electrotechnical Conference - MELECON	en
dc.identifier.doi	10.1109/MELCON.1998.692471	en
dc.identifier.volume	1	en
dc.identifier.spage	474	en
dc.identifier.epage	478	en