Emissivity measurements on historic building materials using dual wavelength infrared thermography

Moropoulou, A; Avdelidis, NP

dc.contributor.author	Moropoulou, A	en
dc.contributor.author	Avdelidis, NP	en
dc.date.accessioned	2014-03-01T02:41:52Z
dc.date.available	2014-03-01T02:41:52Z
dc.date.issued	2001	en
dc.identifier.issn	0277786X	en
dc.identifier.uri	https://dspace.lib.ntua.gr/xmlui/handle/123456789/30639
dc.subject	Dual band infrared thermography	en
dc.subject	Emissivity	en
dc.subject	Historic building materials	en
dc.subject.other	Building materials	en
dc.subject.other	Infrared spectroscopy	en
dc.subject.other	Light emission	en
dc.subject.other	Marble	en
dc.subject.other	Microstructure	en
dc.subject.other	Porous materials	en
dc.subject.other	Dual band infrared thermography	en
dc.subject.other	Thermography (imaging)	en
dc.title	Emissivity measurements on historic building materials using dual wavelength infrared thermography	en
heal.type	conferenceItem	en
heal.identifier.primary	10.1117/12.420995	en
heal.identifier.secondary	http://dx.doi.org/10.1117/12.420995	en
heal.publicationDate	2001	en
heal.abstract	The most reliable method to obtain correct emissivity values for the infrared thermographic systems and applications is to determine the emissivity of the targets to be tested. Although this approach is not possible during in situ applications, samples of the targets can be collected and measured, as in this work, in the laboratory. In the present work, the emissivity values of selected historic building materials were measured at a variety of temperatures, in the 3-5.4 μm and 8-12 μm regions of the infrared spectrum. Porous stones from the Mediterranean area and marbles, used as historic building materials, were investigated. The examined materials presented different emissivity values, caused by their surface state and microstructure. In addition, the effect of temperature and wavelength on the emissivity values of such historic building materials was also considered.	en
heal.journalName	Proceedings of SPIE - The International Society for Optical Engineering	en
dc.identifier.doi	10.1117/12.420995	en
dc.identifier.volume	4360	en
dc.identifier.spage	224	en
dc.identifier.epage	228	en