Image processing techniques for the quantification of defects on aircraft materials obtained from infrared thermographs

Moropoulou, A; Avdelidis, NP; Karoglou, M; Marioli-Riga, ZP

dc.contributor.author	Moropoulou, A	en
dc.contributor.author	Avdelidis, NP	en
dc.contributor.author	Karoglou, M	en
dc.contributor.author	Marioli-Riga, ZP	en
dc.date.accessioned	2014-03-01T02:41:54Z
dc.date.available	2014-03-01T02:41:54Z
dc.date.issued	2001	en
dc.identifier.issn	0277786X	en
dc.identifier.uri	https://dspace.lib.ntua.gr/xmlui/handle/123456789/30659
dc.subject	Aircraft materials	en
dc.subject	Defect detection	en
dc.subject	Image analysis	en
dc.subject	Infrared thermography	en
dc.subject	Measurement of defects	en
dc.subject.other	Aircraft materials	en
dc.subject.other	Cracks	en
dc.subject.other	Image analysis	en
dc.subject.other	Nondestructive examination	en
dc.subject.other	Defect detection	en
dc.subject.other	Thermography (imaging)	en
dc.title	Image processing techniques for the quantification of defects on aircraft materials obtained from infrared thermographs	en
heal.type	conferenceItem	en
heal.identifier.primary	10.1117/12.441417	en
heal.identifier.secondary	http://dx.doi.org/10.1117/12.441417	en
heal.publicationDate	2001	en
heal.abstract	In this research work, an experimental investigation was performed for the determination of defects on aircraft materials. Infrared thermographic active approach was used for the location and identification of defects on cracked aluminum panels untreated and repaired with carbon or boron epoxy composite patches. Furthermore, the quantification of these detected defects was attempted, using selected image processing and analysis techniques. Thermographic image analysis using histograms and digital image processing were applied on these obtained thermal images with the intention of calculating the localized defected areas. The results from these image analysis techniques were compared and discussed in terms of developing an integrated approach for the quantification of defects on aircraft components.	en
heal.journalName	Proceedings of SPIE - The International Society for Optical Engineering	en
dc.identifier.doi	10.1117/12.441417	en
dc.identifier.volume	4548	en
dc.identifier.spage	307	en
dc.identifier.epage	312	en