Development of a high count rate readout system based on a fast, linear transimpedance amplifier for X-ray imaging

Zervakis, E; Papananos, Y; Loukas, D; Haralabidis, N; Pavlidis, A

dc.contributor.author	Zervakis, E	en
dc.contributor.author	Papananos, Y	en
dc.contributor.author	Loukas, D	en
dc.contributor.author	Haralabidis, N	en
dc.contributor.author	Pavlidis, A	en
dc.date.accessioned	2014-03-01T02:42:14Z
dc.date.available	2014-03-01T02:42:14Z
dc.date.issued	2003	en
dc.identifier.issn	10957863	en
dc.identifier.uri	https://dspace.lib.ntua.gr/xmlui/handle/123456789/30880
dc.subject	Data Acquisition System	en
dc.subject	Dynamic Range	en
dc.subject	Imaging System	en
dc.subject	Measurement Noise	en
dc.subject	Transimpedance Amplifier	en
dc.subject	X-ray Imaging	en
dc.subject	Application Specific Integrated Circuit	en
dc.subject	Front End	en
dc.subject	Linear Array	en
dc.subject.other	Application specific integrated circuits	en
dc.subject.other	Cadmium compounds	en
dc.subject.other	Data acquisition	en
dc.subject.other	Image sensors	en
dc.subject.other	Imaging systems	en
dc.subject.other	Imaging techniques	en
dc.subject.other	Natural frequencies	en
dc.subject.other	Photons	en
dc.subject.other	Spurious signal noise	en
dc.subject.other	X rays	en
dc.subject.other	Counting rate	en
dc.subject.other	Digital counting	en
dc.subject.other	Photon conversion sensors	en
dc.subject.other	X-ray imaging	en
dc.subject.other	Signal processing	en
dc.title	Development of a high count rate readout system based on a fast, linear transimpedance amplifier for X-ray imaging	en
heal.type	conferenceItem	en
heal.identifier.primary	10.1109/NSSMIC.2003.1351926	en
heal.identifier.secondary	http://dx.doi.org/10.1109/NSSMIC.2003.1351926	en
heal.identifier.secondary	N36-58	en
heal.publicationDate	2003	en
heal.abstract	A new data acquisition system for processing signals produced by direct photon conversion sensors, primarily for applications in digital X-ray imaging, has been developed. The system comprises a linear array of CdTe sensors, a custom-made PCI card and two application specific integrated circuits (ASICs), a front-end readout chip and a digital counting chip. The operation of the readout ASIC is optimised for input capacitance of 2pF per strip, which includes both the detector and the interconnection capacitance. The dynamic range of the system is extended from 30keV up to 250keV. As the readout chip includes also a polarity select circuit, the system is suitable for applications with both types of detectors, that are electrons or holes collecting devices. Due to the adopted readout architecture the counting rate achieved is extremely high up to 3MHz. In the expense of that, the measured noise was around 1200 electrons for the 2pF detector capacitance. The real-time imaging system would be used in a luggage inspection system. In this paper the architecture and the performance of the two ASICS of the system are presented.	en
heal.journalName	IEEE Nuclear Science Symposium Conference Record	en
dc.identifier.doi	10.1109/NSSMIC.2003.1351926	en
dc.identifier.volume	2	en
dc.identifier.spage	1275	en
dc.identifier.epage	1279	en