A high-counting-rate readout system for X-ray applications

Zervakis, E; Papananos, Y; Loukas, D; Haralabidis, N; Pavlidis, A

dc.contributor.author	Zervakis, E	en
dc.contributor.author	Papananos, Y	en
dc.contributor.author	Loukas, D	en
dc.contributor.author	Haralabidis, N	en
dc.contributor.author	Pavlidis, A	en
dc.date.accessioned	2014-03-01T02:42:23Z
dc.date.available	2014-03-01T02:42:23Z
dc.date.issued	2004	en
dc.identifier.issn	0018-9499	en
dc.identifier.uri	https://dspace.lib.ntua.gr/xmlui/handle/123456789/30982
dc.subject	Author	en
dc.subject	Please supply your own keywords or send a blank e-mail to keywords@ieee.org to receive a list of suggested keywords	en
dc.subject.classification	Engineering, Electrical & Electronic	en
dc.subject.classification	Nuclear Science & Technology	en
dc.subject.other	Photodiode arrays	en
dc.subject.other	Photon transmission	en
dc.subject.other	Solid state sensors	en
dc.subject.other	Transimpedance amplifiers	en
dc.subject.other	Data acquisition	en
dc.subject.other	Image processing	en
dc.subject.other	Large scale systems	en
dc.subject.other	Photodiodes	en
dc.subject.other	Photons	en
dc.subject.other	Spurious signal noise	en
dc.subject.other	X rays	en
dc.subject.other	Application specific integrated circuits	en
dc.title	A high-counting-rate readout system for X-ray applications	en
heal.type	conferenceItem	en
heal.identifier.primary	10.1109/TNS.2004.832646	en
heal.identifier.secondary	http://dx.doi.org/10.1109/TNS.2004.832646	en
heal.language	English	en
heal.publicationDate	2004	en
heal.abstract	A data acquisition system for processing signals produced by direct photon conversion sensors, primarily for applications in digital X-ray imaging, has been developed. The system comprises a custom-made PCI card, a front-end readout ASIC, and a digital counting ASIC. The operation of the readout ASIC is optimized for input capacitance of 2 pF per strip, which includes both the detector and the interconnection capacitance. The dynamic range of the system is extended from 30 up to 250 keV. Since the readout chip also includes a polarity select circuit, the system is suitable for applications with electron or hole collecting detectors. Due to the adopted readout architecture the counting rate achieved is extremely high, up to 3 MHz, while the measured noise was around 1200 electrons for 2 pF detector capacitance. The real-time imaging system is under evaluation in combination with CdTe detectors as front-end of a luggage inspection system. In this paper, the architecture and the performance of the two ASICs of the system are presented.	en
heal.publisher	IEEE-INST ELECTRICAL ELECTRONICS ENGINEERS INC	en
heal.journalName	IEEE Transactions on Nuclear Science	en
dc.identifier.doi	10.1109/TNS.2004.832646	en
dc.identifier.isi	ISI:000223391600091	en
dc.identifier.volume	51	en
dc.identifier.issue	4 I	en
dc.identifier.spage	1840	en
dc.identifier.epage	1847	en