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Growth of poly crystalline La0.5Sr0.5CoO3 films by femtosecond pulsed laser deposition

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dc.contributor.author Brodoceanu, D en
dc.contributor.author Manousaki, A en
dc.contributor.author Zergioti, I en
dc.contributor.author Klini, A en
dc.contributor.author Dinescu, M en
dc.contributor.author Fotakis, C en
dc.date.accessioned 2014-03-01T02:42:48Z
dc.date.available 2014-03-01T02:42:48Z
dc.date.issued 2004 en
dc.identifier.issn 0947-8396 en
dc.identifier.uri https://dspace.lib.ntua.gr/xmlui/handle/123456789/31082
dc.relation.uri http://www.scopus.com/inward/record.url?eid=2-s2.0-4344654749&partnerID=40&md5=b6bef8d03b6bc6979a7fdcfa19629d5a en
dc.subject.classification Materials Science, Multidisciplinary en
dc.subject.classification Physics, Applied en
dc.subject.other Atomic force microscopy en
dc.subject.other Capacitors en
dc.subject.other Lanthanum compounds en
dc.subject.other Polycrystalline materials en
dc.subject.other Scanning electron microscopy en
dc.subject.other Single crystals en
dc.subject.other Thin films en
dc.subject.other X ray diffraction en
dc.subject.other Crystal substrates en
dc.subject.other Femtosecond laser en
dc.subject.other Film deposition en
dc.subject.other Laser fluence en
dc.subject.other Pulsed laser deposition en
dc.title Growth of poly crystalline La0.5Sr0.5CoO3 films by femtosecond pulsed laser deposition en
heal.type conferenceItem en
heal.language English en
heal.publicationDate 2004 en
heal.abstract In this paper we present the growth of La0.5Sr0.5CoO3 (LSCO) films on MgO, quartz, and silicon substrates by pulsed laser deposition (PLD) using a Ti : sapphire laser (50 fs, 800 nm wavelength). The morphology and the structure of the films were studied by X-ray diffraction, atomic force microscopy, and scanning electron microscopy. The films were polycrystalline and exhibit a good adherence to the Si substrate. Different deposition parameters such as substrate temperature, oxygen pressure, and laser fluence were varied to achieve good surface quality and low resistivity crystalline films. We also defined the optimum conditions in which the deposited film surface is particulate free. The best films (droplets free) were grown at 625 degreesC, in an ambient oxygen pressure of 6 mbar, with an incident laser fluence of 0.19 J/cm(2). This is a mandatory step in the complex work of fabricating La0.5Sr0.5CoO3/BaTiO3/La0.5Sr0.5CoO3 heterostructures for the development of thin film capacitors for non-volatile ferroelectric access memory devices. en
heal.publisher SPRINGER en
heal.journalName Applied Physics A: Materials Science and Processing en
dc.identifier.isi ISI:000222766100047 en
dc.identifier.volume 79 en
dc.identifier.issue 4-6 en
dc.identifier.spage 911 en
dc.identifier.epage 914 en


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