Mathematical analysis and simulation for the Electrostatic Discharge (ESD) according to the EN 61000-4-2

Fotis, GP; Gonos, IF; Iracleous, DP; Stathopulos, IA

dc.contributor.author	Fotis, GP	en
dc.contributor.author	Gonos, IF	en
dc.contributor.author	Iracleous, DP	en
dc.contributor.author	Stathopulos, IA	en
dc.date.accessioned	2014-03-01T02:42:52Z
dc.date.available	2014-03-01T02:42:52Z
dc.date.issued	2004	en
dc.identifier.uri	https://dspace.lib.ntua.gr/xmlui/handle/123456789/31112
dc.subject	Computer simulation	en
dc.subject	Differential Equations	en
dc.subject	Electrostatic Discharge (ESD)	en
dc.subject	EN 61000-2	en
dc.subject	ESD generator	en
dc.subject	Human Body model (HBM)	en
dc.subject.other	Differential equations	en
dc.subject.other	Electrostatics	en
dc.subject.other	Networks (circuits)	en
dc.subject.other	Numerical analysis	en
dc.subject.other	Problem solving	en
dc.subject.other	Semiconductor materials	en
dc.subject.other	Electrostatic discharges	en
dc.subject.other	EN 61000-2	en
dc.subject.other	ESD generators	en
dc.subject.other	Human body models	en
dc.subject.other	Electric discharges	en
dc.title	Mathematical analysis and simulation for the Electrostatic Discharge (ESD) according to the EN 61000-4-2	en
heal.type	conferenceItem	en
heal.identifier.primary	10.1109/UPEC.2004.192246	en
heal.identifier.secondary	http://dx.doi.org/10.1109/UPEC.2004.192246	en
heal.publicationDate	2004	en
heal.abstract	This paper is a study for the better understanding of the Electrostatic Discharge (ESD). Electrostatic discharge can change the electrical characteristics of a semiconductor device, degrading or destroying it. Both a mathematical analysis and a simulation process of the ESD generator's circuit of the European Standard 61000-4-2 are presented. In the mathematical aspect of the problem the differential equations for different types of EUT (Equipment Under Test) are solved. In the second part of this paper a computer simulation of these two types of circuits is shown, using both PSPICE and Matlab programs. A comparison between theoretical results of the mathematical analysis and the two simulation processes is obtained. Finally, conclusions for the ESD phenomenon are presented.	en
heal.journalName	39th International Universities Power Engineering Conference, UPEC 2004 - Conference Proceedings	en
dc.identifier.doi	10.1109/UPEC.2004.192246	en
dc.identifier.volume	1	en
dc.identifier.spage	228	en
dc.identifier.epage	232	en