HEAL DSpace

Accuracy analysis of the Method of Auxiliary Sources (MAS) for scattering from a two-layer dielectric circular cylinder

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dc.contributor.author Tsitsas, NL en
dc.contributor.author Alivizatos, EG en
dc.contributor.author Anastassiu, HT en
dc.contributor.author Kaklamani, DI en
dc.date.accessioned 2014-03-01T02:43:05Z
dc.date.available 2014-03-01T02:43:05Z
dc.date.issued 2005 en
dc.identifier.issn 15223965 en
dc.identifier.uri https://dspace.lib.ntua.gr/xmlui/handle/123456789/31227
dc.subject Accuracy Analysis en
dc.subject Circular Cylinder en
dc.subject Numerical Inversion en
dc.subject Optimal Location en
dc.subject Method of Auxiliary Sources en
dc.subject.other Auxiliary equipment en
dc.subject.other Cylinders (shapes) en
dc.subject.other Error correction en
dc.subject.other Inverse problems en
dc.subject.other Measurement errors en
dc.subject.other Scattering en
dc.subject.other Dielectric layers en
dc.subject.other Method of Auxiliary Sources (MAS) en
dc.subject.other Numerical inversion en
dc.subject.other Scattering configuration en
dc.subject.other Dielectric devices en
dc.title Accuracy analysis of the Method of Auxiliary Sources (MAS) for scattering from a two-layer dielectric circular cylinder en
heal.type conferenceItem en
heal.identifier.primary 10.1109/APS.2005.1552515 en
heal.identifier.secondary http://dx.doi.org/10.1109/APS.2005.1552515 en
heal.identifier.secondary 1552515 en
heal.publicationDate 2005 en
heal.abstract The purpose of this paper is the rigorous investigation of the MAS accuracy, when the method is applied to normal incidence scattering by an infinite circular cylinder, composed of two dielectric layers. For this particular scattering configuration, we prove that the MAS matrix is analytically invertible. Numerical results for the computational error, resulting from numerical inversion, and the analytical one are presented. Finally, error minimization indicates the auxiliary sources' optimal location. © 2005 IEEE. en
heal.journalName IEEE Antennas and Propagation Society, AP-S International Symposium (Digest) en
dc.identifier.doi 10.1109/APS.2005.1552515 en
dc.identifier.volume 3 B en
dc.identifier.spage 356 en
dc.identifier.epage 359 en


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