Field screening by amorphous carbon thin films

Xanthakis, JP; Forbes, RG

dc.contributor.author	Xanthakis, JP	en
dc.contributor.author	Forbes, RG	en
dc.date.accessioned	2014-03-01T02:43:20Z
dc.date.available	2014-03-01T02:43:20Z
dc.date.issued	2005	en
dc.identifier.uri	https://dspace.lib.ntua.gr/xmlui/handle/123456789/31339
dc.subject	Amorphous Carbon	en
dc.subject	Charge Distribution	en
dc.subject	Thin Film	en
dc.title	Field screening by amorphous carbon thin films	en
heal.type	conferenceItem	en
heal.identifier.primary	10.1109/IVNC.2005.1619508	en
heal.identifier.secondary	1619508	en
heal.identifier.secondary	http://dx.doi.org/10.1109/IVNC.2005.1619508	en
heal.publicationDate	2005	en
heal.abstract	We argue that the granularity of the screening charge distribution at or in the film surface may dominate the physics of field penetration into hopping conductors (including a-c:H films) and that a re-think of all related modelling looks necessary.	en
heal.journalName	Technical Digest of the 18th International Vacuum Nanoelectronics Conference, IVNC 2005	en
dc.identifier.doi	10.1109/IVNC.2005.1619508	en
dc.identifier.volume	2005	en
dc.identifier.spage	107	en
dc.identifier.epage	108	en