Photoelectrochemical measurements on cathodically electrodeposited films of cadmium and zinc chalcogenide compounds

Bouroushian, M; Kosanovic, T

dc.contributor.author	Bouroushian, M	en
dc.contributor.author	Kosanovic, T	en
dc.date.accessioned	2014-03-01T02:43:28Z
dc.date.available	2014-03-01T02:43:28Z
dc.date.issued	2005	en
dc.identifier.issn	0255-5476	en
dc.identifier.uri	https://dspace.lib.ntua.gr/xmlui/handle/123456789/31425
dc.subject	Carrier generation and recombination	en
dc.subject	Crystalline structure and texture	en
dc.subject	Electrodeposition	en
dc.subject	Hall measurements	en
dc.subject	II-VI semiconductors	en
dc.subject	Nanocrystalline materials	en
dc.subject	Optical properties of thin films	en
dc.subject	Semiconductor photoelectrochemistry	en
dc.subject.classification	Materials Science, Multidisciplinary	en
dc.subject.other	Carrier generation	en
dc.subject.other	Crystalline structure	en
dc.subject.other	Hall measurements	en
dc.subject.other	Laser assisted photoreflection	en
dc.subject.other	Semiconductor photoelectrochemistry	en
dc.subject.other	Cadmium	en
dc.subject.other	Chalcogenides	en
dc.subject.other	Charge transfer	en
dc.subject.other	Electrodeposition	en
dc.subject.other	Hall effect	en
dc.subject.other	Nanocrystalline materials	en
dc.subject.other	Zinc	en
dc.subject.other	Thin films	en
dc.title	Photoelectrochemical measurements on cathodically electrodeposited films of cadmium and zinc chalcogenide compounds	en
heal.type	conferenceItem	en
heal.identifier.primary	10.4028/www.scientific.net/MSF.480-481.1	en
heal.identifier.secondary	http://dx.doi.org/10.4028/www.scientific.net/MSF.480-481.1	en
heal.language	English	en
heal.publicationDate	2005	en
heal.abstract	A variety of electrochemical and electrical techniques is employed in order to determine useful parameters of the optical behaviour of thin semiconducting films. In particular, this work is intended to the characterization of cathodically electrodeposited binary and ternary cadmium and zinc selenides and tellurides by photoelectrochemical (PEC) tests. Typical solid-state techniques, such as reflection, laser assisted photoreflection, resistivity and Hall effect measurements are used as well. A plain relation between crystal structure/film morphology and PEC behavior is established so long as the electrochemical preparation method is capable to explicitly control the deposit structure. In certain cases, a particular charge transfer mechanism in the semiconductor, associated with the existence of a nanostructure, is shown to result in higher photoconversion efficiencies as compared to larger-grained films.	en
heal.publisher	TRANS TECH PUBLICATIONS LTD	en
heal.journalName	Materials Science Forum	en
heal.bookName	MATERIALS SCIENCE FORUM	en
dc.identifier.doi	10.4028/www.scientific.net/MSF.480-481.1	en
dc.identifier.isi	ISI:000228157300001	en
dc.identifier.volume	480-481	en
dc.identifier.spage	1	en
dc.identifier.epage	12	en