Structural characterization and optoelectronic properties of boron thermally diffused SI (400)

Frantzeskakis, E; Tsakiridis, PE; Hristoforou, E

dc.contributor.author	Frantzeskakis, E	en
dc.contributor.author	Tsakiridis, PE	en
dc.contributor.author	Hristoforou, E	en
dc.date.accessioned	2014-03-01T02:43:33Z
dc.date.available	2014-03-01T02:43:33Z
dc.date.issued	2005	en
dc.identifier.issn	1454-4164	en
dc.identifier.uri	https://dspace.lib.ntua.gr/xmlui/handle/123456789/31473
dc.relation.uri	http://www.scopus.com/inward/record.url?eid=2-s2.0-22544459922&partnerID=40&md5=7928095aa42bde0704de54a17659eda2	en
dc.subject	Boron	en
dc.subject	Optoelectronic properties	en
dc.subject	Silicon (400)	en
dc.subject	Thermal Diffusion	en
dc.subject.classification	Materials Science, Multidisciplinary	en
dc.subject.classification	Optics	en
dc.subject.classification	Physics, Applied	en
dc.subject.other	SILICON	en
dc.subject.other	JUNCTIONS	en
dc.subject.other	IMPLANTATION	en
dc.subject.other	SUBMICRON	en
dc.subject.other	SI(001)	en
dc.title	Structural characterization and optoelectronic properties of boron thermally diffused SI (400)	en
heal.type	conferenceItem	en
heal.language	English	en
heal.publicationDate	2005	en
heal.abstract	Thermal diffusion of boron into silicon single crystal at 1100 degrees C, followed by annealing, in inert atmosphere, has been investigated with respect to corresponding optoelectronic properties. A layer of boron powder, deposited on a silicon (400) wafer, was used as a dopant source for B. The cold resistance response of the films with respect to light of different wavelengths was used for the quantification of their optoelectronic properties. A correlation between the optoelectronic behavior and the structural characterization of the produced samples was also realized.	en
heal.publisher	NATL INST OPTOELECTRONICS	en
heal.journalName	Journal of Optoelectronics and Advanced Materials	en
dc.identifier.isi	ISI:000229987500055	en
dc.identifier.volume	7	en
dc.identifier.issue	3	en
dc.identifier.spage	1499	en
dc.identifier.epage	1509	en