A low-voltage CMOS LNA with multiple magnetic feedback for WLAN applications

Vitzilaios, G; Papananos, Y; Theodoratos, G; Vasilopoulos, A

dc.contributor.author	Vitzilaios, G	en
dc.contributor.author	Papananos, Y	en
dc.contributor.author	Theodoratos, G	en
dc.contributor.author	Vasilopoulos, A	en
dc.date.accessioned	2014-03-01T02:43:49Z
dc.date.available	2014-03-01T02:43:49Z
dc.date.issued	2006	en
dc.identifier.issn	02714310	en
dc.identifier.uri	https://dspace.lib.ntua.gr/xmlui/handle/123456789/31522
dc.subject	High Frequency	en
dc.subject	Low Noise Amplifier	en
dc.subject	Low Voltage	en
dc.subject	Noise Figure	en
dc.subject	Positive Feedback	en
dc.subject.other	CMOS integrated circuits	en
dc.subject.other	Feedback	en
dc.subject.other	Natural frequencies	en
dc.subject.other	Topology	en
dc.subject.other	Transistors	en
dc.subject.other	Low-Noise-Amplifier (LNA)	en
dc.subject.other	Monolithic transformer	en
dc.subject.other	Noise Figure (NF)	en
dc.subject.other	Amplifiers (electronic)	en
dc.title	A low-voltage CMOS LNA with multiple magnetic feedback for WLAN applications	en
heal.type	conferenceItem	en
heal.identifier.primary	10.1109/ISCAS.2006.1693630	en
heal.identifier.secondary	http://dx.doi.org/10.1109/ISCAS.2006.1693630	en
heal.identifier.secondary	1693630	en
heal.publicationDate	2006	en
heal.abstract	A CMOS Low-Noise-Amplifier (LNA) topology that utilizes multiple monolithic transformer magnetic feedback is presented. The proposed topology permits negative and positive feedback to be applied constructively, in order to simultaneously neutralize the gate-drain overlap capacitance of the amplifying transistor and achieve high gain at high frequencies when driving an on-chip capacitance. It also allows for a stable design with adequate gain and large reverse isolation without Noise Figure (NF) degradation. Simulation results indicate voltage conversion gain of 17 dB, NF of 1.6 dB and third-order input intercept point (IIP3) of 13 dBm. The design is being implemented in a 0.13 μm CMOS technology. © 2006 IEEE.	en
heal.journalName	Proceedings - IEEE International Symposium on Circuits and Systems	en
dc.identifier.doi	10.1109/ISCAS.2006.1693630	en
dc.identifier.spage	4503	en
dc.identifier.epage	4506	en