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Nanoparticles for charge storage using hybrid organic inorganic devices

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dc.contributor.author Tsoukalas, D en
dc.contributor.author Kolliopoulou, S en
dc.contributor.author Dimitrakis, P en
dc.contributor.author Normand, P en
dc.contributor.author Petty, MC en
dc.date.accessioned 2014-03-01T02:45:40Z
dc.date.available 2014-03-01T02:45:40Z
dc.date.issued 2008 en
dc.identifier.uri https://dspace.lib.ntua.gr/xmlui/handle/123456789/32323
dc.subject Flash memory en
dc.subject Nanoparticles en
dc.subject Self-assembly en
dc.subject Wafer bonding en
dc.subject.other Data storage equipment en
dc.subject.other Electronic properties en
dc.subject.other Flash memory en
dc.subject.other Gold deposits en
dc.subject.other Materials en
dc.subject.other Nanoparticles en
dc.subject.other Self assembly en
dc.subject.other Semiconducting silicon compounds en
dc.subject.other Silicon wafers en
dc.subject.other Three dimensional en
dc.subject.other Vanadium en
dc.subject.other 3-D architectures en
dc.subject.other Charge storages en
dc.subject.other Electrical characteristics en
dc.subject.other Functionalization en
dc.subject.other Gate oxides en
dc.subject.other Gate stack materials en
dc.subject.other Gold nanoparticles en
dc.subject.other Hybrid silicons en
dc.subject.other Langmuir-Blodgett techniques en
dc.subject.other Low temperatures en
dc.subject.other Memory cells en
dc.subject.other Memory devices en
dc.subject.other Memory windows en
dc.subject.other Mos fets en
dc.subject.other Organic insulators en
dc.subject.other Organic technologies en
dc.subject.other Organic-inorganic en
dc.subject.other Program/erase en
dc.subject.other Read-only memories en
dc.subject.other V grooves en
dc.subject.other Voltage pulse en
dc.subject.other Wafer bonding en
dc.title Nanoparticles for charge storage using hybrid organic inorganic devices en
heal.type conferenceItem en
heal.identifier.primary 10.4028/www.scientific.net/AST.54.451 en
heal.identifier.secondary http://dx.doi.org/10.4028/www.scientific.net/AST.54.451 en
heal.publicationDate 2008 en
heal.abstract We present a concept for integration of low temperature fabricated memory devices in a 3-D architecture using a hybrid silicon-organic technology. The realization of electrically erasable read-only memory (EEPROM) like device is based on the fabrication of a V-groove SiGe MOSFET, the functionalization of a gate oxide followed by self-assembly of gold nanoparticles and finally, the deposition of an organic insulator by Langmuir-Blodgett (LB) technique. Such structures were processed at a temperature lower than 400°C following a process based on wafer bonding. The electrical characteristics of the final hybrid MISFET memory cells were evaluated in terms of memory window and program/erase voltage pulses. A model describing the memory characteristics, based on the electronic properties of the gate stack materials, is presented. © 2008 Trans Tech Publications, Switzerland. en
heal.journalName CIMTEC 2008 - Proceedings of the 3rd International Conference on Smart Materials, Structures and Systems - Smart Materials and Micro/Nanosystems en
dc.identifier.doi 10.4028/www.scientific.net/AST.54.451 en
dc.identifier.volume 54 en
dc.identifier.spage 451 en
dc.identifier.epage 457 en


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