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Assembly of charged nanoparticles by self-electrodynamic focusing

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dc.contributor.author Tang, J en
dc.contributor.author Verrelli, E en
dc.contributor.author Tsoukalas, D en
dc.date.accessioned 2014-03-01T02:45:58Z
dc.date.available 2014-03-01T02:45:58Z
dc.date.issued 2009 en
dc.identifier.issn 0957-4484 en
dc.identifier.uri https://dspace.lib.ntua.gr/xmlui/handle/123456789/32493
dc.subject Electric Field en
dc.subject Monte Carlo Simulation en
dc.subject Self Assembly en
dc.subject.classification Engineering, Multidisciplinary en
dc.subject.classification Nanoscience & Nanotechnology en
dc.subject.classification Materials Science, Multidisciplinary en
dc.subject.classification Physics, Applied en
dc.subject.other Charged nanoparticles en
dc.subject.other Focusing effect en
dc.subject.other Monte Carlo Simulation en
dc.subject.other Photoresist patterning en
dc.subject.other Photoresist patterns en
dc.subject.other Self assembly process en
dc.subject.other Semi-conducting nanoparticles en
dc.subject.other Silicon substrates en
dc.subject.other Computer simulation en
dc.subject.other Electric fields en
dc.subject.other Monte Carlo methods en
dc.subject.other Photoresistors en
dc.subject.other Photoresists en
dc.subject.other Self assembly en
dc.subject.other Semiconducting silicon en
dc.subject.other Semiconducting silicon compounds en
dc.subject.other Surface treatment en
dc.subject.other Nanoparticles en
dc.title Assembly of charged nanoparticles by self-electrodynamic focusing en
heal.type conferenceItem en
heal.identifier.primary 10.1109/ESSDERC.2009.5331603 en
heal.identifier.secondary http://dx.doi.org/10.1109/ESSDERC.2009.5331603 en
heal.identifier.secondary 5331603 en
heal.language English en
heal.publicationDate 2009 en
heal.abstract We demonstrate a self-assembly process of charged metallic or semiconducting nanoparticles on silicon substrates using conventional photoresist patterning. The self-assembly of nanoparticles is mainly due to a self-electric focusing effect created by the electric field of charged nanoparticles landed on the photoresist patterns. The detailed parameters that affect the focusing effect are investigated both experimentally and theoretically using Monte Carlo simulations. The presented technique is a simple and effective method for the fabrication of patterned nanoparticle lines made from different materials. ©2009 IEEE. en
heal.publisher IOP PUBLISHING LTD en
heal.journalName ESSDERC 2009 - Proceedings of the 39th European Solid-State Device Research Conference en
dc.identifier.doi 10.1109/ESSDERC.2009.5331603 en
dc.identifier.isi ISI:000269077000019 en
dc.identifier.volume 20 en
dc.identifier.issue 36 en
dc.identifier.spage 456 en
dc.identifier.epage 459 en


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