dc.contributor.author |
Tang, J |
en |
dc.contributor.author |
Verrelli, E |
en |
dc.contributor.author |
Tsoukalas, D |
en |
dc.date.accessioned |
2014-03-01T02:45:58Z |
|
dc.date.available |
2014-03-01T02:45:58Z |
|
dc.date.issued |
2009 |
en |
dc.identifier.issn |
0957-4484 |
en |
dc.identifier.uri |
https://dspace.lib.ntua.gr/xmlui/handle/123456789/32493 |
|
dc.subject |
Electric Field |
en |
dc.subject |
Monte Carlo Simulation |
en |
dc.subject |
Self Assembly |
en |
dc.subject.classification |
Engineering, Multidisciplinary |
en |
dc.subject.classification |
Nanoscience & Nanotechnology |
en |
dc.subject.classification |
Materials Science, Multidisciplinary |
en |
dc.subject.classification |
Physics, Applied |
en |
dc.subject.other |
Charged nanoparticles |
en |
dc.subject.other |
Focusing effect |
en |
dc.subject.other |
Monte Carlo Simulation |
en |
dc.subject.other |
Photoresist patterning |
en |
dc.subject.other |
Photoresist patterns |
en |
dc.subject.other |
Self assembly process |
en |
dc.subject.other |
Semi-conducting nanoparticles |
en |
dc.subject.other |
Silicon substrates |
en |
dc.subject.other |
Computer simulation |
en |
dc.subject.other |
Electric fields |
en |
dc.subject.other |
Monte Carlo methods |
en |
dc.subject.other |
Photoresistors |
en |
dc.subject.other |
Photoresists |
en |
dc.subject.other |
Self assembly |
en |
dc.subject.other |
Semiconducting silicon |
en |
dc.subject.other |
Semiconducting silicon compounds |
en |
dc.subject.other |
Surface treatment |
en |
dc.subject.other |
Nanoparticles |
en |
dc.title |
Assembly of charged nanoparticles by self-electrodynamic focusing |
en |
heal.type |
conferenceItem |
en |
heal.identifier.primary |
10.1109/ESSDERC.2009.5331603 |
en |
heal.identifier.secondary |
http://dx.doi.org/10.1109/ESSDERC.2009.5331603 |
en |
heal.identifier.secondary |
5331603 |
en |
heal.language |
English |
en |
heal.publicationDate |
2009 |
en |
heal.abstract |
We demonstrate a self-assembly process of charged metallic or semiconducting nanoparticles on silicon substrates using conventional photoresist patterning. The self-assembly of nanoparticles is mainly due to a self-electric focusing effect created by the electric field of charged nanoparticles landed on the photoresist patterns. The detailed parameters that affect the focusing effect are investigated both experimentally and theoretically using Monte Carlo simulations. The presented technique is a simple and effective method for the fabrication of patterned nanoparticle lines made from different materials. ©2009 IEEE. |
en |
heal.publisher |
IOP PUBLISHING LTD |
en |
heal.journalName |
ESSDERC 2009 - Proceedings of the 39th European Solid-State Device Research Conference |
en |
dc.identifier.doi |
10.1109/ESSDERC.2009.5331603 |
en |
dc.identifier.isi |
ISI:000269077000019 |
en |
dc.identifier.volume |
20 |
en |
dc.identifier.issue |
36 |
en |
dc.identifier.spage |
456 |
en |
dc.identifier.epage |
459 |
en |