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Formation and characterization of CdSe thin films on Ni substrate

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dc.contributor.author Athanassopoulou, MD en
dc.contributor.author Argyropoulos, Th en
dc.contributor.author Mergos, JA en
dc.contributor.author Novakovic, J en
dc.contributor.author Dervos, CT en
dc.date.accessioned 2014-03-01T02:46:48Z
dc.date.available 2014-03-01T02:46:48Z
dc.date.issued 2010 en
dc.identifier.uri https://dspace.lib.ntua.gr/xmlui/handle/123456789/32861
dc.subject High Temperature en
dc.subject Scanning Electron Microscopy en
dc.subject Thermal Treatment en
dc.subject Thin Film en
dc.subject X Ray Diffraction en
dc.subject Zinc en
dc.subject.other Acid sulfates en
dc.subject.other Barrier layers en
dc.subject.other Bath temperatures en
dc.subject.other Cathodic electrodeposition en
dc.subject.other CdSe thin films en
dc.subject.other Cubic structure en
dc.subject.other High temperature en
dc.subject.other Ni substrates en
dc.subject.other Post thermal treatment en
dc.subject.other Rectifying properties en
dc.subject.other SEM en
dc.subject.other Zinc blende en
dc.subject.other Cadmium alloys en
dc.subject.other Cadmium compounds en
dc.subject.other Deposits en
dc.subject.other Distillation en
dc.subject.other Electrodeposition en
dc.subject.other Scanning electron microscopy en
dc.subject.other Semiconducting films en
dc.subject.other Thin films en
dc.subject.other X ray diffraction en
dc.subject.other Zinc en
dc.subject.other Film preparation en
dc.title Formation and characterization of CdSe thin films on Ni substrate en
heal.type conferenceItem en
heal.identifier.primary 10.1109/MELCON.2010.5476258 en
heal.identifier.secondary http://dx.doi.org/10.1109/MELCON.2010.5476258 en
heal.identifier.secondary 5476258 en
heal.publicationDate 2010 en
heal.abstract Preparation and characterization of CdSe thin film semiconductors, prepared by cathodic electrodeposition from an acid sulfate solution (CdSO4 - SeO2), were investigated. The effect of the bath temperature and how it affects the CdSe deposits was studied. The formation of compact barrier layers of zinc blende CdSe was attained. X-ray diffraction (XRD) and scanning electron microscopy (SEM) tests present a remarkably intense cubic structure, without any post-thermal treatment. The Ni/CdSe/Au structure may exhibit rectifying properties depending on the temperature during the electrodeposition. High temperature baths make the deposits to obtain ohmic properties. © 2010 IEEE. en
heal.journalName Proceedings of the Mediterranean Electrotechnical Conference - MELECON en
dc.identifier.doi 10.1109/MELCON.2010.5476258 en
dc.identifier.spage 374 en
dc.identifier.epage 377 en


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