A theoretical calculation of the electrical characteristics of the NFESE microscopy

Kyritsakis, A; Xanthakis, JP; Kirk, TL; Pescia, D

dc.contributor.author	Kyritsakis, A	en
dc.contributor.author	Xanthakis, JP	en
dc.contributor.author	Kirk, TL	en
dc.contributor.author	Pescia, D	en
dc.date.accessioned	2014-03-01T02:47:15Z
dc.date.available	2014-03-01T02:47:15Z
dc.date.issued	2011	en
dc.identifier.uri	https://dspace.lib.ntua.gr/xmlui/handle/123456789/33036
dc.relation.uri	http://www.scopus.com/inward/record.url?eid=2-s2.0-80052908778&partnerID=40&md5=82efd8823f2a5ea1769c1562ce6c1b86	en
dc.relation.uri	http://ieeexplore.ieee.org/stamp/stamp.jsp?arnumber=06004576	en
dc.relation.uri	http://ieeexplore.ieee.org/xpls/abs_all.jsp?arnumber=6004576	en
dc.subject	Emission current	en
dc.subject	Field emission	en
dc.subject	NFESEM	en
dc.subject	WKB approximation	en
dc.subject.other	3-dimensional	en
dc.subject.other	Constant current	en
dc.subject.other	Electrical characteristic	en
dc.subject.other	Emission current	en
dc.subject.other	Near-field scanning electron microscopy	en
dc.subject.other	NFESEM	en
dc.subject.other	Theoretical calculations	en
dc.subject.other	WKB approximations	en
dc.subject.other	Approximation theory	en
dc.subject.other	Field emission	en
dc.subject.other	Scanning electron microscopy	en
dc.subject.other	Vacuum	en
dc.subject.other	Nanoelectronics	en
dc.title	A theoretical calculation of the electrical characteristics of the NFESE microscopy	en
heal.type	conferenceItem	en
heal.identifier.secondary	6004576	en
heal.publicationDate	2011	en
heal.abstract	In the Near Field Scanning Electron Microscopy recently developed the tip of the microscope is placed a few tens of nm away from the anode. Measurements of voltage with respect to the tip-anode distance at constant current have been taken by Kirk et al. We have used a 3-dimensional WKB approximation to simulate these measurements. Our results are consistently 5-10 volts below the experimental ones. This was attributed to a thin WO3 layer on the tip which we have not taken into account.	en
heal.journalName	Proceedings - IVNC 2011: 2011 24th International Vacuum Nanoelectronics Conference	en
dc.identifier.spage	89	en
dc.identifier.epage	90	en