EXACT AND STRONGLY CONVERGENT FIELD EXPANSIONS IN RECTANGULARLY SHIELDED CYLINDRICAL AND MICROSTRIP CONDUCTORS.

Fikioris, JG; Tsalamengas, JL

dc.contributor.author	Fikioris, JG	en
dc.contributor.author	Tsalamengas, JL	en
dc.date.accessioned	2014-03-01T02:47:46Z
dc.date.available	2014-03-01T02:47:46Z
dc.date.issued	1986	en
dc.identifier.issn	0167403X	en
dc.identifier.uri	https://dspace.lib.ntua.gr/xmlui/handle/123456789/33331
dc.relation.uri	http://www.scopus.com/inward/record.url?eid=2-s2.0-0022945519&partnerID=40&md5=46a241447ff40c51829d3a2d32032642	en
dc.subject.other	ELECTRIC CONDUCTORS - Electromagnetic Shielding	en
dc.subject.other	CONVERGENT FIELD	en
dc.subject.other	EIGENFUNCTION EXPANSIONS	en
dc.subject.other	GREEN'S FUNCTION	en
dc.subject.other	MICROSTRIP CONDUCTORS	en
dc.subject.other	ROUND CONDUCTORS	en
dc.subject.other	TEM MODE	en
dc.subject.other	MICROSTRIP DEVICES	en
dc.title	EXACT AND STRONGLY CONVERGENT FIELD EXPANSIONS IN RECTANGULARLY SHIELDED CYLINDRICAL AND MICROSTRIP CONDUCTORS.	en
heal.type	conferenceItem	en
heal.publicationDate	1986	en
heal.abstract	Exact analytical field solutions, expressed in terms of strongly and uniformly convergent eigenfunction expansions, are obtained for the TEM mode in rectangularly shielded round and strip conductors of various configurations without limitations on the dimensions. Shielded microstrip conductors printed on a dielectric sublayer are treated. The analysis is based on the solution of singular integral equations, of Hilbert-type for round conductors, of Carleman-type for strip ones, by the Carleman-Vekua method of regularization, which proceeds by inverting the dominant equation. Crucial to the approach is the availability of strongly and uniformly convergent eigenfunction expansions for the Green's function G of the configuration. The G-function constitutes the kernel of the integral equations and has its singular (logarithmic) term extracted out of the expansion in closed form. Characteristic values of shielded lines have been checked against existing approximate results.	en
heal.publisher	Elsevier Science Publ, Amsterdam, Neth & New, York, NY	en
heal.journalName	Studies in Electrical and Electronic Engineering	en
dc.identifier.spage	355	en
dc.identifier.epage	357	en