dc.contributor.author |
Papadimitriou, D |
en |
dc.contributor.author |
Ptak, AJ |
en |
dc.contributor.author |
Korakakis, D |
en |
dc.contributor.author |
Giles, NC |
en |
dc.contributor.author |
Myers, TH |
en |
dc.date.accessioned |
2014-03-01T02:49:16Z |
|
dc.date.available |
2014-03-01T02:49:16Z |
|
dc.date.issued |
2002 |
en |
dc.identifier.issn |
02729172 |
en |
dc.identifier.uri |
https://dspace.lib.ntua.gr/xmlui/handle/123456789/34454 |
|
dc.relation.uri |
http://www.scopus.com/inward/record.url?eid=2-s2.0-0036375740&partnerID=40&md5=ae0983660cd6d2d2803741d91d6db56e |
en |
dc.subject.other |
Molecular beam epitaxy |
en |
dc.subject.other |
Oxygen |
en |
dc.subject.other |
Plasma applications |
en |
dc.subject.other |
Raman spectroscopy |
en |
dc.subject.other |
Semiconducting films |
en |
dc.subject.other |
Semiconductor doping |
en |
dc.subject.other |
Semiconductor growth |
en |
dc.subject.other |
Strain |
en |
dc.subject.other |
Compressive strain |
en |
dc.subject.other |
Film polarity |
en |
dc.subject.other |
Gallium nitride film |
en |
dc.subject.other |
Oxygen doped gallium nitride |
en |
dc.subject.other |
Plasma-assisted molecular beam epitaxy |
en |
dc.subject.other |
Strain effect |
en |
dc.subject.other |
Gallium nitride |
en |
dc.title |
Raman studies on oxygen doped GaN grown by molecular beam epitaxy |
en |
heal.type |
conferenceItem |
en |
heal.publicationDate |
2002 |
en |
heal.abstract |
High quality Ga-polarity GaN films were grown by plasma-assisted molecular beam epitaxy to study strain effects due to oxygen incorporation. Oxygen concentrations up to 2 × 1022 cm-3 were studied. Layers containing oxygen at levels above 1022 cm-3 exhibit severe cracking while oxygen concentrations less than 1021 cm-3 apparently does not introduce significant strain. Raman spectra of O2-doped films were evaluated with respect to spectra of unintentionally doped GaN films (n=4×1014 cm-3) grown under the same conditions except for the O2-flux. Analysis of the E2 (high frequency phonon mode near 570 cm-1) Raman band indicated the heaviest doped samples exhibit compressive strain. Frequency-shifts between 0.7 and 0.9 cm-1 were observed as a function of the distance from the crack edges in the heavily doped samples, implying a strain (δα/α) of the order of 5×10-4. |
en |
heal.journalName |
Materials Research Society Symposium - Proceedings |
en |
dc.identifier.volume |
693 |
en |
dc.identifier.spage |
41 |
en |
dc.identifier.epage |
46 |
en |