dc.contributor.author |
Panagopoulos, CN |
en |
dc.contributor.author |
Georgarakis, KG |
en |
dc.contributor.author |
Carabelas, A |
en |
dc.contributor.author |
Manousaki, A |
en |
dc.date.accessioned |
2014-03-01T02:49:16Z |
|
dc.date.available |
2014-03-01T02:49:16Z |
|
dc.date.issued |
2002 |
en |
dc.identifier.issn |
0277786X |
en |
dc.identifier.uri |
https://dspace.lib.ntua.gr/xmlui/handle/123456789/34462 |
|
dc.subject.other |
Aluminum alloys |
en |
dc.subject.other |
Annealing |
en |
dc.subject.other |
Excimer lasers |
en |
dc.subject.other |
High power lasers |
en |
dc.subject.other |
Laser pulses |
en |
dc.subject.other |
Optical microscopy |
en |
dc.subject.other |
Profilometry |
en |
dc.subject.other |
Radiation effects |
en |
dc.subject.other |
Scanning electron microscopy |
en |
dc.subject.other |
Surface treatment |
en |
dc.subject.other |
X ray diffraction analysis |
en |
dc.subject.other |
Laser radiation |
en |
dc.subject.other |
Laser treatment |
en |
dc.subject.other |
Laser applications |
en |
dc.title |
Surface modifications of 2024 Al alloy by laser treatment |
en |
heal.type |
conferenceItem |
en |
heal.identifier.primary |
10.1117/12.513594 |
en |
heal.identifier.secondary |
http://dx.doi.org/10.1117/12.513594 |
en |
heal.publicationDate |
2002 |
en |
heal.abstract |
Specimens of 2024 Al alloy (Al- 4,4%Cu-l,5%Mg-0,6%Mn) were annealed at 400°C for two (2) hrs. After annealing, the alloy specimens were surface treated with a high power KrF Excimer Laser. The wavelength of laser radiation was 248nm and the time duration of each pulse was 30ns. The surface treatment of 2024 Al alloy was conducted by changing the value of power of the incident laser radiation. The radiation frequency was 7Hz, the overlapping was 50% and the pulses per step (pps) were 50. The changes in the power of incident laser radiation led the surface layers of the alloy to undertake various modifications. These processes were carefully studied by observing the surface modifications of the alloy with an Optical Microscope, a Scanning Electron Microscope, a X-Rays Diffractometer and a Surface Profilometer. |
en |
heal.journalName |
Proceedings of SPIE - The International Society for Optical Engineering |
en |
dc.identifier.doi |
10.1117/12.513594 |
en |
dc.identifier.volume |
5131 |
en |
dc.identifier.spage |
169 |
en |
dc.identifier.epage |
176 |
en |