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Surface modifications of 2024 Al alloy by laser treatment

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dc.contributor.author Panagopoulos, CN en
dc.contributor.author Georgarakis, KG en
dc.contributor.author Carabelas, A en
dc.contributor.author Manousaki, A en
dc.date.accessioned 2014-03-01T02:49:16Z
dc.date.available 2014-03-01T02:49:16Z
dc.date.issued 2002 en
dc.identifier.issn 0277786X en
dc.identifier.uri https://dspace.lib.ntua.gr/xmlui/handle/123456789/34462
dc.subject.other Aluminum alloys en
dc.subject.other Annealing en
dc.subject.other Excimer lasers en
dc.subject.other High power lasers en
dc.subject.other Laser pulses en
dc.subject.other Optical microscopy en
dc.subject.other Profilometry en
dc.subject.other Radiation effects en
dc.subject.other Scanning electron microscopy en
dc.subject.other Surface treatment en
dc.subject.other X ray diffraction analysis en
dc.subject.other Laser radiation en
dc.subject.other Laser treatment en
dc.subject.other Laser applications en
dc.title Surface modifications of 2024 Al alloy by laser treatment en
heal.type conferenceItem en
heal.identifier.primary 10.1117/12.513594 en
heal.identifier.secondary http://dx.doi.org/10.1117/12.513594 en
heal.publicationDate 2002 en
heal.abstract Specimens of 2024 Al alloy (Al- 4,4%Cu-l,5%Mg-0,6%Mn) were annealed at 400°C for two (2) hrs. After annealing, the alloy specimens were surface treated with a high power KrF Excimer Laser. The wavelength of laser radiation was 248nm and the time duration of each pulse was 30ns. The surface treatment of 2024 Al alloy was conducted by changing the value of power of the incident laser radiation. The radiation frequency was 7Hz, the overlapping was 50% and the pulses per step (pps) were 50. The changes in the power of incident laser radiation led the surface layers of the alloy to undertake various modifications. These processes were carefully studied by observing the surface modifications of the alloy with an Optical Microscope, a Scanning Electron Microscope, a X-Rays Diffractometer and a Surface Profilometer. en
heal.journalName Proceedings of SPIE - The International Society for Optical Engineering en
dc.identifier.doi 10.1117/12.513594 en
dc.identifier.volume 5131 en
dc.identifier.spage 169 en
dc.identifier.epage 176 en


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