The role of emissivity in infrared thermographic imaging and testing of building and structural materials

Moropoulou, A; Avdelidis, NP

dc.contributor.author	Moropoulou, A	en
dc.contributor.author	Avdelidis, NP	en
dc.date.accessioned	2014-03-01T02:49:17Z
dc.date.available	2014-03-01T02:49:17Z
dc.date.issued	2002	en
dc.identifier.issn	0277786X	en
dc.identifier.uri	https://dspace.lib.ntua.gr/xmlui/handle/123456789/34467
dc.subject	Building materials	en
dc.subject	Emissivity	en
dc.subject	Infrared thermography	en
dc.subject	Structural materials	en
dc.subject	Surface condition	en
dc.subject	Temperature	en
dc.subject.other	Composition	en
dc.subject.other	Infrared radiation	en
dc.subject.other	Mortar	en
dc.subject.other	Optical properties	en
dc.subject.other	Plaster	en
dc.subject.other	Textures	en
dc.subject.other	Thermal effects	en
dc.subject.other	Infrared cameras	en
dc.subject.other	Thermography (imaging)	en
dc.title	The role of emissivity in infrared thermographic imaging and testing of building and structural materials	en
heal.type	conferenceItem	en
heal.identifier.primary	10.1117/12.459576	en
heal.identifier.secondary	http://dx.doi.org/10.1117/12.459576	en
heal.publicationDate	2002	en
heal.abstract	Emissivity can be defined as an expression that describes the optical properties of a material in sense of the extent of energy emitted with regard to an ideal black body. Since there is no infrared camera that can read temperature directly, correct emissivity values ought to be measured with the intention of interpreting thermal images obtained from thermographic surveys. In the present work, the emissivity values of numerous building and structural materials, such as stones, plasters, mortars, marbles and mosaics' tesserae, were calculated in accordance with the relevant ASTM standard approach or by the use of an empirical laboratory developed approach. The obtained emissivity values were discussed and explained in terms of the approach used, the wavelength effect, as well as the materials surface condition.	en
heal.journalName	Proceedings of SPIE - The International Society for Optical Engineering	en
dc.identifier.doi	10.1117/12.459576	en
dc.identifier.volume	4710	en
dc.identifier.spage	281	en
dc.identifier.epage	287	en