A knowledge - Based classification method for polanmetiric SAR data

Dabboor, M; Karathanassi, V

dc.contributor.author	Dabboor, M	en
dc.contributor.author	Karathanassi, V	en
dc.date.accessioned	2014-03-01T02:49:59Z
dc.date.available	2014-03-01T02:49:59Z
dc.date.issued	2005	en
dc.identifier.issn	0277786X	en
dc.identifier.uri	https://dspace.lib.ntua.gr/xmlui/handle/123456789/34843
dc.subject	Entropy/a/Anisotropy	en
dc.subject	Freeman - Durdan analysis	en
dc.subject	Object -oriented classification	en
dc.subject	Pauli analysis	en
dc.subject	Polarimetry	en
dc.subject.other	Anisotropy	en
dc.subject.other	Backscattering	en
dc.subject.other	Data reduction	en
dc.subject.other	Image analysis	en
dc.subject.other	Object oriented programming	en
dc.subject.other	Polarimeters	en
dc.subject.other	Entropy/a/Anisotropy	en
dc.subject.other	Freeman - Durdan analysis	en
dc.subject.other	Object -oriented classification	en
dc.subject.other	Pauli analysis	en
dc.subject.other	Synthetic aperture radar	en
dc.title	A knowledge - Based classification method for polanmetiric SAR data	en
heal.type	conferenceItem	en
heal.identifier.primary	10.1117/12.627070	en
heal.identifier.secondary	http://dx.doi.org/10.1117/12.627070	en
heal.identifier.secondary	59800C	en
heal.publicationDate	2005	en
heal.abstract	Full polarimetric data can define the scattering behavior of land use/cover through several approaches. Several classification methods have been proposed based on analysis methods. These classification methods are based on the backscattering mechanisms which are extracted using a single decomposition method. The objectives of this work are a) the investigation of the different polarimetric analysis methods; b) the interpretation of the images resulting from polarimetric analysis; c) the development of an object -oriented classification method based on polarimetric analysis imagery and the comparison of this method with the H/a and the H/a Wishart classification methods respectively.	en
heal.journalName	Proceedings of SPIE - The International Society for Optical Engineering	en
dc.identifier.doi	10.1117/12.627070	en
dc.identifier.volume	5980	en