Propagating variability from technology to system level

Dierickx, B; Miranda, M; Dobrovolny, P; Kutscherauer, F; Papanikolaou, A; Marchal, P

dc.contributor.author	Dierickx, B	en
dc.contributor.author	Miranda, M	en
dc.contributor.author	Dobrovolny, P	en
dc.contributor.author	Kutscherauer, F	en
dc.contributor.author	Papanikolaou, A	en
dc.contributor.author	Marchal, P	en
dc.date.accessioned	2014-03-01T02:50:59Z
dc.date.available	2014-03-01T02:50:59Z
dc.date.issued	2007	en
dc.identifier.uri	https://dspace.lib.ntua.gr/xmlui/handle/123456789/35271
dc.subject	Design Flow	en
dc.subject	Monte Carlo	en
dc.subject	Monte Carlo Technique	en
dc.subject	Rare Event	en
dc.title	Propagating variability from technology to system level	en
heal.type	conferenceItem	en
heal.identifier.primary	10.1109/IWPSD.2007.4472457	en
heal.identifier.secondary	http://dx.doi.org/10.1109/IWPSD.2007.4472457	en
heal.publicationDate	2007	en
heal.abstract	As CMOS technology feature sizes decrease, variability more and more jeopardizes system level parametric and functional yield. This paper proposes a framework that can capture variability at all levels in the design flow. It offers a correlated view on yield, timing, dynamic and static energy. Preservation on rare events in variability distributions is obtained by the Weighted Monte Carlo technique.	en
heal.journalName	International Workshop on Physics of Semiconductor Devices	en
dc.identifier.doi	10.1109/IWPSD.2007.4472457	en