Reliability and radiation effects in IC technologies

Schrimpf, R; Warren, K; Weller, R; Reed, R; Massengill, L; Alles, M; Fleetwood, D; Zhou, X; Tsetseris, L; Pantelides, S

dc.contributor.author	Schrimpf, R	en
dc.contributor.author	Warren, K	en
dc.contributor.author	Weller, R	en
dc.contributor.author	Reed, R	en
dc.contributor.author	Massengill, L	en
dc.contributor.author	Alles, M	en
dc.contributor.author	Fleetwood, D	en
dc.contributor.author	Zhou, X	en
dc.contributor.author	Tsetseris, L	en
dc.contributor.author	Pantelides, S	en
dc.date.accessioned	2014-03-01T02:51:29Z
dc.date.available	2014-03-01T02:51:29Z
dc.date.issued	2008	en
dc.identifier.uri	https://dspace.lib.ntua.gr/xmlui/handle/123456789/35510
dc.subject	Energetic Particles	en
dc.subject	Integrated Circuit	en
dc.subject	Ionizing Radiation	en
dc.subject	Normal Operator	en
dc.subject	Radiation Effect	en
dc.subject	Single Event Upset	en
dc.subject	Soft Error	en
dc.subject	Error Rate	en
dc.subject	Single Event Effect	en
dc.subject	Total Ionizing Dose	en
dc.title	Reliability and radiation effects in IC technologies	en
heal.type	conferenceItem	en
heal.identifier.primary	10.1109/RELPHY.2008.4558869	en
heal.identifier.secondary	http://dx.doi.org/10.1109/RELPHY.2008.4558869	en
heal.publicationDate	2008	en
heal.abstract	The reliability of advanced integrated circuit (IC) technologies may be dominated by the interaction of environmental radiation with the devices in the ICs. In particular, single event upsets (SEUs) and soft errors produced by single energetic particles may have a significant impact on the error rate of digital ICs. Additionally, some of the mechanisms responsible for long-term degradation of ICs	en
heal.journalName	Reliability Physics, Annual International Symposium	en
dc.identifier.doi	10.1109/RELPHY.2008.4558869	en